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Chao, J.R.
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1

Changes in Specific Heat of Corn Starch Due to Gelatinizati..:

Hwang, C. H. ; Heldman, D. R. ; Chao, R. R..
Journal of Food Science.  64 (1999)  1 - p. 141-144 , 1999
Link: https://doi.org/10.1111/..
 
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2

SIMULATION OF THE EVAPORATIVE COOLING PROCESS FOR TORTILLAS:

TAYLOR, T.A. ; HELDMAN, D.R. ; CHAO, R.R..
Journal of Food Process Engineering.  21 (1998)  5 - p. 407-425 , 1998
Link: https://doi.org/10.1111/..
 
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3

8MO Adagrasib (MRTX849) in patients with advanced/metastati..:

Jänne, P.A. ; Spira, A. ; Riely, G.J....
Journal of Thoracic Oncology.  18 (2023)  4 - p. S41-S42 , 2023
Link: https://doi.org/10.1016/..
 
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4

MA06.04 KRYSTAL-1: Two-Year Follow-Up of Adagrasib (MRTX849..:

Gadgeel, S. ; Jänne, P.A. ; Spira, A.I....
Journal of Thoracic Oncology.  18 (2023)  11 - p. S118 , 2023
Link: https://doi.org/10.1016/..
 
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5

Lonicera flos and Cnicus japonicus extracts improved egg qu..:

Liu, Z.P. ; Chao, J.R. ; Xu, P.T....
Poultry Science.  102 (2023)  4 - p. 102561 , 2023
Link: https://doi.org/10.1016/..
 
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6

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
Link: https://doi.org/10.1109/..
 
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7

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
Link: https://doi.org/10.1109/..
 
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8

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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9

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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10

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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11

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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12

Interleukin-4 Restores Insulin Sensitivity in Insulin-Resis..:

Chao, R. ; Li, D. ; Yue, Z....
Biochemistry (Moscow).  85 (2020)  3 - p. 334-343 , 2020
Link: https://doi.org/10.1134/..
 
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13

A Novel Dry Selective Etch of SiGe for the Enablement of Hi..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Loubet, N. ; Kal, S. ; Alix, C.... - p. 11.4.1-11.4.4 , 2019
Link: https://doi.org/10.1109/..
 
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14

Full Bottom Dielectric Isolation to Enable Stacked Nanoshee..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Zhang, J. ; Frougier, J. ; Greene, A.... - p. 11.6.1-11.6.4 , 2019
Link: https://doi.org/10.1109/..
 
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15

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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