Search for persons
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Investigation of the Impact of Ferroelectricity Boosted Gat..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-..:
, In:
?
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
5
Lowest IOFF −21 A/μm in capacitorless DRAM achieved by Reac..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
6
Reliability challenges in Forksheet Devices: (Invited Paper:
, In:
?
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
10
A Comprehensive Cryogenic CMOS Variability and Reliability ..:
, In:
?
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
11
On The Contribution of Secondary Holes in Hot-Carrier Degra..:
, In:
?
2022 IEEE International Reliability Physics Symposium (IRPS) ,
12
Modelling ultra-fast threshold voltage instabilities in Hf-..:
, In:
?
2022 IEEE International Integrated Reliability Workshop (IIRW) ,
13
Degradation mapping of IGZO TFTs:
, In:
?
2022 International Electron Devices Meeting (IEDM) ,
14
Characterizing and Modelling of the BTI Reliability in IGZO..:
, In:
?
2022 IEEE International Reliability Physics Symposium (IRPS) ,
15