Chen, Chiu-ling
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5

Evaluation of temperature distribution of LED module:

Fu, Han-Kuei ; Wang, Chien-Ping ; Chiang, Hsin-Chien...
Microelectronics Reliability.  53 (2013)  4 - p. 554-559 , 2013
 
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9

Model to determine the capacity of wafer fabrications for b..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Tu, Ying-mei ; Chen, Chiu-ling. (2011)  10/11 - p. 2907-2923
Copies: Zentrale;
 
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10

Model to determine the capacity of wafer fabrications for b..:

Tu, Ying-Mei ; Chen, Chiu-Ling
International Journal of Production Research.  49 (2011)  10 - p. 2907-2923 , 2011
 
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11

Failure and degradation mechanisms of high-power white ligh..:

Yang, Shih-Chun ; Lin, Pang ; Wang, Chien-Ping...
Microelectronics Reliability.  50 (2010)  7 - p. 959-964 , 2010
 
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13

The evaluation for the chromatic characteristics of LED mod..:

Fu, Han Kuei ; Peng, Yi Ping ; Ying, Shang Pin...
Microelectronics Reliability.  53 (2013)  12 - p. 1916-1921 , 2013
 
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