Chen, Gengshen
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1

Characterization of LDO Induced Increment of SEE Sensitivit..:

Cai, Chang ; Liu, Yuzhu ; Hu, Minchi..
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 537-543 , 2023
 
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Genetic basis of resistance to southern corn leaf blight in..:

Chen, Gengshen ; Xiao, Yingjie ; Dai, Sha...
Plant Biotechnology Journal.  21 (2023)  3 - p. 506-520 , 2023
 
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New QTL for resistance to Puccinia polysora Underw in maize:

Deng, Ce ; Li, Huimin ; Li, Zhimin...
Journal of Applied Genetics.  60 (2019)  2 - p. 147-150 , 2019
 
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14

Association mapping resolving the major loci Scmv2 conferri..:

Li, Zhimin ; Chen, Jiafa ; Han, Liping...
European Journal of Plant Pathology.  145 (2016)  2 - p. 385-391 , 2016
 
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