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Chen, Jwu E.
241  results:
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1

Using the Test Guardband Estimation Method to Forecast Futu..:

Yeh, Chung-Huang ; Chen, Jwu E.
IETE Journal of Research.  , 2024
Link: https://doi.org/10.1080/..
 
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2

Multiple Retest Systems for Screening High-Quality Chips:

Yeh, Chung-Huang ; Chen, Jwu E.
Journal of Electronic Testing.  , 2023
Link: https://doi.org/10.1007/..
 
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3

Wafer Scratch Pattern Reconstruction for High Diagnosis Acc..:

Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Liao, Peter Yi-Yu...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 272-281 , 2022
Link: https://doi.org/10.1109/..
 
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4

Wafer Defect Pattern Labeling and Recognition Using Semi-Su..:

Li, Katherine Shu-Min ; Jiang, Xu-Hao ; Chen, Leon Li-Yang...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 291-299 , 2022
Link: https://doi.org/10.1109/..
 
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5

Innovative Practice on Wafer Test Innovations:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Hu, Dyi-Chung ; Hashimoto, Hirohito ; Tseng, Li-Fong... - p. 1-1 , 2020
Link: https://doi.org/10.1109/..
 
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6

The Decision Mechanism Uses the Multiple-Tests Scheme to Im..:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
Yeh, Chung-Huang ; Chen, Jwu E - p. 88-93 , 2020
Link: https://doi.org/10.1109/..
 
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7

Test yield and quality analysis models of chips:

Yeh, Chung Huang ; Chen, Jwu E
Journal of the Chinese Institute of Engineers.  43 (2020)  3 - p. 279-287 , 2020
Link: https://doi.org/10.1080/..
 
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8

Repeated Testing Applications for Improving the IC Test Qua..:

Yeh, Chung-Huang ; Chen, Jwu E.
Journal of Electronic Testing.  35 (2019)  4 - p. 459-472 , 2019
Link: https://doi.org/10.1007/..
 
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9

IEEE Standard 1500 Compatible Oscillation Ring Test Methodo..:

Li, Katherine Shu-Min ; Lee, Chung-Len ; Su, Chauchin.
Journal of Electronic Testing.  23 (2007)  4 - p. 341-355 , 2007
Link: https://doi.org/10.1007/..
 
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10

IEEE standard 1500 compatible interconnect diagnosis for de..:

, In: Proceedings of the 2006 Asia and South Pacific Design Automation Conference,
Li, Katherine Shu-Min ; Chang, Yao-Wen ; Su, Chauchin.. - p. 366-371 , 2006
Link: https://dl.acm.org/doi/1..
 
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11

Oscillation ring based interconnect test scheme for SOC:

, In: Proceedings of the 2005 Asia and South Pacific Design Automation Conference,
Li, Katherine Shu-Min ; Lee, Chung Len ; Su, Chauchin. - p. 184-187 , 2005
Link: https://dl.acm.org/doi/1..
 
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12

IDENTIFICATION OF ROBUST UNTESTABLE PATH DELAY FAULTS:

Wu, Wen Ching ; Lee, Chung Len ; Chen, Jwu E.
Journal of the Chinese Institute of Engineers.  20 (1997)  5 - p. 549-559 , 1997
Link: https://doi.org/10.1080/..
 
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13

Checkpoints in irredundant two-level combinational circuits:

Chen, Jwu E. ; Lee, Chung Len ; Shen, Wen Zen
Journal of Electronic Testing.  2 (1991)  4 - p. 395-397 , 1991
Link: https://doi.org/10.1007/..
 
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14

Retesting Schemes That Improve Test Quality and Yield Using..:

Yeh, Chung-Huang ; Chen, Jwu-E
Eng.  4 (2023)  4 - p. 3007-3025 , 2023
Link: https://doi.org/10.3390/..
 
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15

Using Enhanced Test Systems Based on Digital IC Test Model ..:

Yeh, Chung-Huang ; Chen, Jwu-E ; Chang, Chia-Jui.
Electronics.  11 (2022)  7 - p. 1115 , 2022
Link: https://doi.org/10.3390/..
 
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