Search for persons
X
?
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
4
A Combination of Implant Shadow and Skin Effects Leading to..:
, In:
?
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
5
RESURF Region Variation Induced Current Crowding Effect on ..:
, In:
?
2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
10
Transmission Line Pulse Width Impacting on Device Performan..:
, In:
?
2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
13