Chen, Leon Li-Yang
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2

Wafer Defect Pattern Labeling and Recognition Using Semi-Su..:

Li, Katherine Shu-Min ; Jiang, Xu-Hao ; Chen, Leon Li-Yang...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 291-299 , 2022
 
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3

TestDNA-E: Wafer Defect Signature for Pattern Recognition b..:

Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Cheng, Ken Chau-Cheung...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 372-374 , 2022
 
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4

Wafer Scratch Pattern Reconstruction for High Diagnosis Acc..:

Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Liao, Peter Yi-Yu...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 272-281 , 2022
 
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5

Integrated Scratch Marker for Wafer Defect Diagnosis:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
 
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7

Wafer-Level Test Path Pattern Recognition and Test Characte..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
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8

Wafer-level test path pattern recognition and test characte..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
 
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9

Study human pancreatic cancer in mice: How close are they?:

Zhang, Yuqing ; Chen, Leon ; Yang, Jingxuan...
Biochimica et Biophysica Acta (BBA) - Reviews on Cancer.  1835 (2013)  1 - p. 110-118 , 2013
 
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10

Vertebrate animal models of glioma: Understanding the mecha..:

Chen, Leon ; Zhang, Yuqing ; Yang, Jingxuan..
Biochimica et Biophysica Acta (BBA) - Reviews on Cancer.  1836 (2013)  1 - p. 158-165 , 2013
 
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11

Pancreatic cancer tumour initiating cells: the molecular re..:

Ni, Xiaoling ; Long, Jiang ; Cen, Putao...
Journal of Cellular and Molecular Medicine.  16 (2012)  5 - p. 988-994 , 2012
 
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14

Causes of Visual Impairment and Blindness in the 2006 and 2..:

Zhao, Jialiang ; Xu, Xiao ; Ellwein, Leon B....
American Journal of Ophthalmology.  197 (2019)  - p. 80-87 , 2019
 
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