Search for persons
X
?
2022 IEEE International Test Conference (ITC) ,
1
Wafer Defect Pattern Classification with Explainable-Decisi..:
, In:
?
2021 IEEE International Test Conference in Asia (ITC-Asia) ,
5
Integrated Scratch Marker for Wafer Defect Diagnosis:
, In:
?
2020 IEEE International Test Conference (ITC) ,
6
TestDNA-E: Wafer Defect Signature for Pattern Recognition b..:
, In:
?
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
7
Wafer-Level Test Path Pattern Recognition and Test Characte..:
, In:
?
Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
8