Chen, Min-Cheng
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1

Reduced Switching Current with a Light Metal in a Tri-layer..:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
Wu, Yu-Hui ; Cheng, Chih-Wei ; Lin, Yu-Lon.. - p. 1-2 , 2023
 
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2

Two-Dimensionally Arranged Display Drivers Achieved by OS/S..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Komura, Yusuke ; Miyata, Shoki ; Okamoto, Yuki... - p. 1-2 , 2023
 
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3

P‐151: Late‐News Poster: 1.5‐inch, 3207‐ppi Foveated Displa..:

Tamatsukuri, Yuki ; Miyata, Shoki ; Komura, Yusuke...
SID Symposium Digest of Technical Papers.  54 (2023)  1 - p. 1641-1644 , 2023
 
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32‐1: Oxide Semiconductor Field‐Effect Transistor for High‐..:

Okazaki, Yutaka ; Sawai, Hiromi ; Endo, Masami...
SID Symposium Digest of Technical Papers.  53 (2022)  1 - p. 377-380 , 2022
 
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32‐3: 1.5‐inch, 3207‐ppi Side‐by‐Side OLED Display Capable ..:

Kozuma, Munehiro ; Okamoto, Yuki ; Ito, Minato...
SID Symposium Digest of Technical Papers.  53 (2022)  1 - p. 384-387 , 2022
 
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10‐1: Layout of 1.50‐inch, 3207‐ppi OLED Display with OSLSI..:

Saito, Toshihiko ; Mizuguchi, Toshiki ; Okamoto, Yuki...
SID Symposium Digest of Technical Papers.  53 (2022)  1 - p. 94-97 , 2022
 
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8

Relationship of Channel and Surface Orientation to Mechanic..:

CHANG, Wen-Teng ; LIN, Shih-Wei ; CHEN, Min-Cheng.
IEICE Transactions on Electronics.  E102.C (2019)  6 - p. 429-434 , 2019
 
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9

Suppression of short channel effects in FinFETs using cryst..:

Tsai, Meng-Chen ; Wang, Chin-I ; Chen, Yen-Chang...
Semiconductor Science and Technology.  33 (2018)  3 - p. 035013 , 2018
 
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10

Erratum: "Fabrication of High-Sensitivity Polycrystalline S..:

Chen, Hou-Yu ; Lin, Chia-Yi ; Chen, Min-Cheng..
Japanese Journal of Applied Physics.  57 (2018)  5 - p. 059202 , 2018
 
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11

Cover Picture: Investigation of strain-induced phase transf..:

Chiu, Yu-Chien ; Cheng, Chun-Hu ; Chang, Chun-Yen..
physica status solidi (RRL) - Rapid Research Letters.  11 (2017)  3 - p. 1770312 , 2017
 
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12

A numerical study of Si-TMD contact with n/p type operation..:

, In: 2016 IEEE International Electron Devices Meeting (IEDM),
Tang, Ying-Tsan ; Li, Kai-Shin ; Li, Lain-Jong... - p. 14.3.1-14.3.4 , 2016
 
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