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Chen, Shuang-Yuan
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1

Nano-node n-type Gate Dielectric Integrity and Uniformity C..:

, In: 2019 8th International Symposium on Next Generation Electronics (ISNE),
Chang, Chih-Chieh ; Lu, Chih-Cheng ; Wang, Mu-Chun... - p. 1-3 , 2019
Link: https://doi.org/10.1109/..
 
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2

I-V model of nano nMOSFETs incorporating drift and diffusio..:

Huang, Heng-Sheng ; Wang, Wei-Lun ; Wang, Mu-Chun...
Vacuum.  155 (2018)  - p. 76-82 , 2018
Link: https://doi.org/10.1016/..
 
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3

Electrical stress probing recovery efficiency of 28 nm HK/M..:

Wang, Shea-Jue ; Sung, Shun-Ping ; Wang, Mu-Chun...
Vacuum.  153 (2018)  - p. 117-121 , 2018
Link: https://doi.org/10.1016/..
 
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4

Heat stress exposing performance of deep-nano HK/MG nMOSFET..:

Wang, Shea-Jue ; Wang, Mu-Chun ; Chen, Shuang-Yuan...
Microelectronics Reliability.  55 (2015)  11 - p. 2203-2207 , 2015
Link: https://doi.org/10.1016/..
 
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5

Positive bias temperature instability in p-type metal-oxide..:

Samanta, Piyas ; Huang, Heng-Sheng ; Chen, Shuang-Yuan..
Journal of Applied Physics.  115 (2014)  7 - p. , 2014
Link: https://doi.org/10.1063/..
 
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6

Electron detrapping in thin hafnium silicate and nitrided h..:

Huang, Heng-Sheng ; Samanta, Piyas ; Tzeng, Tsung-Jian..
Applied Physics Letters.  100 (2012)  2 - p. , 2012
Link: https://doi.org/10.1063/..
 
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7

Interface trap generation and recovery mechanisms during an..:

Samanta, Piyas ; Huang, Heng-Sheng ; Chen, Shuang-Yuan..
Applied Physics Letters.  100 (2012)  20 - p. , 2012
Link: https://doi.org/10.1063/..
 
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8

Degradation Mechanism for Continuous-Wave Green Laser-Cryst..:

Wang, Mu-Chun ; Yang, Hsin-Chia ; Hsu, Hong-Wen...
Japanese Journal of Applied Physics.  50 (2011)  4S - p. 04DH16 , 2011
Link: https://doi.org/10.1143/..
 
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9

Degradation Mechanism for Continuous-Wave Green Laser-Cryst..:

Wang, Mu-Chun ; Yang, Hsin-Chia ; Hsu, Hong-Wen...
Japanese Journal of Applied Physics.  50 (2011)  4S - p. 04DH16 , 2011
Link: https://doi.org/10.7567/..
 
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10

Temperature dependence of substrate currents of MOSFETs und..:

Liu, Chuan-Hsi ; Chen, Shuang-Yuan ; Tu, Chia-Hao...
Journal of the Chinese Institute of Engineers.  34 (2011)  3 - p. 441-448 , 2011
Link: https://doi.org/10.1080/..
 
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11

Substrate current verifying lateral electrical field under ..:

Huang, Heng-Sheng ; Wang, Mu-Chun ; Hsieh, Zhen-Ying...
Solid-State Electronics.  54 (2010)  5 - p. 527-529 , 2010
Link: https://doi.org/10.1016/..
 
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12

Reliability Characteristics of D2O-Radical Annealed ALD HfO..:

Tu, Chia-Hao ; Chiu, Fu-Chien ; Chen, Chun-Heng...
ECS Transactions.  28 (2010)  2 - p. 331-338 , 2010
Link: https://doi.org/10.1149/..
 
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13

Defect Generation and Severity Comparison of Negative Bias ..:

Chen, Shuang-Yuan ; Tu, Chia-Hao
Japanese Journal of Applied Physics.  49 (2010)  4S - p. 04DC26 , 2010
Link: https://doi.org/10.1143/..
 
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14

Promoting of charged-device model/electrostatic discharge i..:

Wang, Mu-Chun ; Liu, Chuan-Hsi ; Huang, Kuo-Shu...
Microelectronics Reliability.  50 (2010)  6 - p. 839-846 , 2010
Link: https://doi.org/10.1016/..
 
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15

Interfacial and Electrical Characterization in Metal–Oxide–..:

Chiu, Fu-Chien ; Chen, Shuang-Yuan ; Chen, Chun-Heng...
Japanese Journal of Applied Physics.  48 (2009)  4S - p. 04C014 , 2009
Link: https://doi.org/10.1143/..
 
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