E-LIB Suche - Ergebnisse für: Chen, ZhuoJun

1

A Compute-in-Memory Annealing Processor With Interaction Co..:

Zhou, Yifeng ; Su, Guocheng ; Zhou, Jinrong..
IEEE Journal of Solid-State Circuits. , 2024

Link: https://doi.org/10.1109/..

2

Single-Event Burnout Effects of Complementary LDMOS Devices..:

Chen, Chonghao ; Xu, Jiang ; Chen, Zhuojun
IEEE Transactions on Device and Materials Reliability. , 2024

Link: https://doi.org/10.1109/..

3

Design and Implementation of a High-Voltage Radiation-Hard ..:

Li, Guofeng ; Zhang, Shuo ; Yin, Longjing.
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 888-894 , 2024

Link: https://doi.org/10.1109/..

4

Improving Radiation Reliability of SRAM-Based Physical Uncl..:

Chen, Zhuojun ; Yang, Wenhao ; Chen, Jinghang..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 32 (2024) 2 - p. 372-381 , 2024

Link: https://doi.org/10.1109/..

5

A Source Segmented LDMOS Structure for Improving Single Eve..:

Xu, Jiang ; Lei, Zeyu ; Zhang, Chenchen..
IEEE Transactions on Device and Materials Reliability. 24 (2024) 1 - p. 105-111 , 2024

Link: https://doi.org/10.1109/..

6

Influence of metal electrodes on the irradiation resistance..:

Yan, Shaoan ; Zang, Junyi ; Zhu, Yingfang...
Journal of Alloys and Compounds. 976 (2024) - p. 173175 , 2024

Link: https://doi.org/10.1016/..

7

Microdose Effect of SGT MOSFETs induced by Heavy Ions:

, In: 2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED),

Chen, ZhuoJun ; Xu, Jiang ; Lei, ZeYu.. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

8

A rapid and reliable method for the determination of Lactip..:

Wang, Jie ; Wei, Bo ; Chen, Zhuojun...
Frontiers in Microbiology. 14 (2023) - p. , 2023

Link: https://doi.org/10.3389/..

9

Single-Event Transient Effect and Hardness Design of DSD Po..:

, In: 2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED),

Chen, ZhuoJun ; Shuai, PengFei - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

10

Effects of different metal electrodes on the ferroelectric ..:

Xu, Pei ; Yan, Shaoan ; Zhu, Yingfang...
Journal of Materials Science: Materials in Electronics. 34 (2023) 28 - p. , 2023

Link: https://doi.org/10.1007/..

11

PUF-CIM: SRAM-Based Compute-In-Memory With Zero Bit-Error-R..:

Chen, Zhuojun ; Wu, Ming ; Zhou, Yifeng...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31 (2023) 8 - p. 1234-1247 , 2023

Link: https://doi.org/10.1109/..

12

DA PUF : dual-state analog PUF:

, In: Proceedings of the 59th ACM/IEEE Design Automation Conference,

Zhang, Jiliang ; Ding, Lin ; Chen, Zhuojun.. - p. 73-78 , 2022

Link: https://dl.acm.org/doi/1..

13

Comprehensive study of the radiation effects on the LDMOS t..:

Lei, Zeyu ; Zhang, Chenchen ; Wu, Ming...
Microelectronics Reliability. 139 (2022) - p. 114793 , 2022

Link: https://doi.org/10.1016/..

14

STT-MRAM-Based Reliable Weak PUF:

Hu, Yupeng ; Wu, Linjun ; Chen, Zhuojun...
IEEE Transactions on Computers. 71 (2022) 7 - p. 1564-1574 , 2022

Link: https://doi.org/10.1109/..

15

Recent progress in ferroelectric synapses and their applica..:

Yan, Shaoan ; Zang, Junyi ; Xu, Pei...
Science China Materials. 66 (2022) 3 - p. 877-894 , 2022

Link: https://doi.org/10.1007/..