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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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RESURF Region Variation Induced Current Crowding Effect on ..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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A Combination of Implant Shadow and Skin Effects Leading to..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Bipolar Transistors' Holding Phenomena:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Transmission Line Pulse Width Impacting on Device Performan..:
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2022 IEEE International Conference on Consumer Electronics - Taiwan ,
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Gate Voltages Impacting on Latch-up Measurements:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN ..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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The Failure Mechanism of the Guard-Rings in Two Different P..:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Optimization on On-Chip Surge Protection Device for USB Typ..:
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2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) ,
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Analyzing Gate-Driven Circuit Parameters for Adding ESD Per..:
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2019 IEEE Intl Conf on Parallel & Distributed Processing with Applications, Big Data & Cloud Computing, Sustainable Computing & Communications, Social Computing & Networking (ISPA/BDCloud/SocialCom/SustainCom) ,
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