Cheng, Chao-Ching
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1

Contact Optimization Through Annealing and Edge Functionali..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
 
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3

Effect of Oxygen Treatment on the Electrical Performance an..:

Chen, Yi-Xuan ; Wang, Yi-Lin ; Li, Fu-Jyuan...
IEEE Transactions on Nanotechnology.  23 (2024)  - p. 299-302 , 2024
 
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4

Comprehensive Study of Contact Length Scaling Down to 12 nm..:

Wu, Wen-Chia ; Hung, Terry Y. T. ; Sathaiya, D. Mahaveer...
IEEE Transactions on Electron Devices.  70 (2023)  12 - p. 6680-6686 , 2023
 
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6

Scaled contact length with low contact resistance in monola..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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8

High-Endurance MoS2 FeFET with Operating Voltage Fess Than ..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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9

Status and Performance of Integration Modules Toward Scaled..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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11

Monolayer-MoS2 Stacked Nanosheet Channel with C-type Metal ..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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12

Wafer-Scale Bi-Assisted Semi-Auto Dry Transfer and Fabricat..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Li, Ming-Yang ; Hsu, Ching-Hao ; Shen, Shin-Wei... - p. 290-291 , 2022
 
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14

Perspective on Low-dimensional Channel Materials for Extrem..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Su, Sheng-Kai ; Chen, Edward ; Hung, Terry Y. T.... - p. 403-404 , 2022
 
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15

Nearly Ideal Subthreshold Swing in Monolayer MoS₂ Top-Gate ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lee, Tsung-En ; Su, Yuan-Chun ; Lin, Bo-Jiun... - p. 7.4.1-7.4.4 , 2022
 
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