I agree that this site is using cookies. You can find further informations here.
X
Cherkaoui, K.
619  results:
Search for persons X
?
1

High-k/InGaAs interface defects at cryogenic temperature:

Cherkaoui, K. ; La Torraca, P. ; Lin, J....
Solid-State Electronics.  207 (2023)  - p. 108719 , 2023
Link: https://doi.org/10.1016/..
 
?
2

Growth chemistry and electrical performance of ultrathin al..:

Snelgrove, M. ; McFeely, C. ; Hughes, G....
Microelectronic Engineering.  266 (2022)  - p. 111888 , 2022
Link: https://doi.org/10.1016/..
 
?
3

Investigating interface states and oxide traps in the MoS2/..:

Coleman, E. ; Mirabelli, G. ; Bolshakov, P....
Solid-State Electronics.  186 (2021)  - p. 108123 , 2021
Link: https://doi.org/10.1016/..
 
?
4

Application of artificial neural networks to the identifica..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronics Reliability.  126 (2021)  - p. 114312 , 2021
Link: https://doi.org/10.1016/..
 
?
5

On the interpretation of MOS impedance data in both series ..:

Caruso, E. ; Lin, J. ; Monaghan, S....
Solid-State Electronics.  185 (2021)  - p. 108098 , 2021
Link: https://doi.org/10.1016/..
 
?
6

Detection of inhibitory effects in the generation of breakd..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronic Engineering.  215 (2019)  - p. 111023 , 2019
Link: https://doi.org/10.1016/..
 
?
7

Effect of Low Temperature RF Plasma Treatment on Electrical..:

Gomeniuk, Y. V. ; Gomeniuk, Y. Y. ; Rudenko, T. E....
ECS Journal of Solid State Science and Technology.  8 (2019)  2 - p. Q24-Q31 , 2019
Link: https://doi.org/10.1149/..
 
?
8

Relationship between capacitance and conductance in MOS cap..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Caruso, E. ; Hurley, P. K. ; Lin, J.... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
?
9

Characterization of the Failure Site Distribution in MIM De..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Journal of Electronic Materials.  47 (2018)  9 - p. 5033-5038 , 2018
Link: https://doi.org/10.1007/..
 
?
10

Inversion in the In0.53Ga0.47As metal-oxide-semiconductor s..:

O'Connor, É. ; Cherkaoui, K. ; Monaghan, S....
Applied Physics Letters.  110 (2017)  3 - p. , 2017
Link: https://doi.org/10.1063/..
 
?
11

Exploratory study and application of the angular wavelet an..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Journal of Applied Physics.  122 (2017)  21 - p. , 2017
Link: https://doi.org/10.1063/..
 
?
12

Spatial analysis of failure sites in large area MIM capacit..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronic Engineering.  178 (2017)  - p. 10-16 , 2017
Link: https://doi.org/10.1016/..
 
?
13

Effect of forming gas annealing on the inversion response a..:

O'Connor, É. ; Cherkaoui, K. ; Monaghan, S....
Microelectronic Engineering.  147 (2015)  - p. 325-329 , 2015
Link: https://doi.org/10.1016/..
 
?
14

Electrical characterisation of InGaAs on insulator structur..:

Cherkaoui, K. ; Gomeniuk, Y.Y. ; Daix, N....
Microelectronic Engineering.  147 (2015)  - p. 63-66 , 2015
Link: https://doi.org/10.1016/..
 
?
15

Multi-frequency inversion-charge pumping for charge separat..:

Djara, V. ; Cherkaoui, K. ; Negara, M. A..
Journal of Applied Physics.  118 (2015)  20 - p. , 2015
Link: https://doi.org/10.1063/..
 
1-15