Chevalier, P.
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1

A Methodology to Address RF Aging of 40nm CMOS PA Cells Und..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Divay, A. ; Dehos, C. ; Charlet, I.... - p. 4B.2-1-4B.2-6 , 2024
 
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Optimizing RFSOI Performance through a T-shaped Gate and Na..:

, In: 2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
Lucci, L. ; Cremer, S. ; Duriez, B.... - p. 61-64 , 2023
 
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4

NEXN-mediated cardiomyopathies: Prevalence, phenotypic expr..:

Hermida, A. ; Ader, F. ; Millat, G....
Archives of Cardiovascular Diseases Supplements.  15 (2023)  1 - p. 43 , 2023
 
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5

A cost effective RF-SOI Drain Extended MOS transistor featu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Garros, X. ; Divay, A. ; Lacord, J.... - p. 1-4 , 2023
 
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8

40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fM..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Cremer, S. ; Pelloux, N. ; Gianesello, F.... - p. 101-104 , 2023
 
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9

Low Frequency Noise Study of X-ray Irradiated Si/SiGe:C BiC..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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10

Low-Noise Si/SiGe HBT for LEO Satellite User Terminals in K..:

, In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
Gauthier, A. ; Brezza, E. ; Montagne, A.... - p. 187-190 , 2023
 
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13

Advanced 200-mm RF SOI Technology exhibiting $78\ \text{fs}..:

, In: 2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
Gianesello, F. ; Fleury, A. ; Julien, F.... - p. 191-194 , 2022
 
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14

0.13 μm HR SiGe BiCMOS Technology exhibiting 169 fs Ron x C..:

, In: 2022 International Electron Devices Meeting (IEDM),
Gianesello, F. ; Charbuillet, C. ; Derrier, N.... - p. 11.7.1-11.7.4 , 2022
 
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