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Chiocchetta, Francesca
14  results:
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1

Thermally-activated failure mechanisms of 0.25 \ \mu \mathr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Gao, Zhan ; Chiocchetta, Francesca ; Rampazzo, Fabiana... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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2

Short term reliability and robustness of ultra-thin barrier..:

Gao, ZHan ; Meneghini, Matteo ; Harrouche, Kathia...
Microelectronics Reliability.  123 (2021)  - p. 114199 , 2021
Link: https://doi.org/10.1016/..
 
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3

Detrapping Kinetics in N-polar AlGaN/GaN MIS-HEMTs:

, In: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA),
Chiocchetta, Francesca ; Calascione, Claudia ; De Santi, Carlo... - p. 90-94 , 2021
Link: https://doi.org/10.1109/..
 
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4

Short Term Reliability and Robustness of ultra-thin barrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Gao, Zhan. ; Meneghini, Matteo. ; Harrouche, Kathia... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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5

Reliability Physics of GaN HEMT Microwave Devices: The Age ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Zanoni, Enrico ; Meneghini, Matteo ; Meneghesso, Gaudenzio... - p. 1-10 , 2020
Link: https://doi.org/10.1109/..
 
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6

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199.  , 2021
Link: https://hal.science/hal-..
 
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7

Short Term Reliability and Robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
http://arxiv.org/abs/2107.08410.  , 2021
Link: http://arxiv.org/abs/210..
 
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8

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199.  , 2021
Link: https://hal.archives-ouv..
 
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9

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199.  , 2021
Link: https://hal.science/hal-..
 
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10

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199.  , 2021
Link: https://hal.science/hal-..
 
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11

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IPFA49335.2020.9260793.  , 2020
Link: https://hal.science/hal-..
 
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12

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IPFA49335.2020.9260793.  , 2020
Link: https://hal.archives-ouv..
 
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13

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IPFA49335.2020.9260793.  , 2020
Link: https://hal.science/hal-..
 
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14

Short term reliability and robustness of ultra-thin barrier..:

Gao, Zhan ; Meneghini, Matteo ; Harrouche, Kathia...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IPFA49335.2020.9260793.  , 2020
Link: https://hal.science/hal-..
 
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