Chiu, Yingta
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1

Critical Challenges with Copper Hybrid Bonding for Chip-to-..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Zhou, Wei ; Kwon, Michael ; Chiu, Yingta... - p. 336-341 , 2023
 
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2

Light enhanced direct Cu bonding for advanced electronic as..:

Liang, Sin-Yong ; Song, Jenn-Ming ; Huang, Shang-Kun...
Journal of Materials Science: Materials in Electronics.  29 (2018)  16 - p. 14144-14150 , 2018
 
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3

Softening of Micro Sn Electrodeposit by Polyethylene Glycol..:

Chiu, Tsung-Chieh ; Chiu, Ying-Ta ; Lin, Kwang-Lung
ECS Journal of Solid State Science and Technology.  7 (2018)  3 - p. P109-P113 , 2018
 
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4

Enhanced Cu-to-Cu direct bonding by controlling surface phy..:

Chiang, Po-Hao ; Liang, Sin-Yong ; Song, Jenn-Ming...
Japanese Journal of Applied Physics.  56 (2017)  3 - p. 035503 , 2017
 
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5

Effects of electromagnetic radiation exposure on direct Cu ..:

, In: 2017 5th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D),
 
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8

Low-temperature Cu-to-Cu bonding using silver nanoparticles..:

Li, Wen-Hua ; Lin, Pei-Syuan ; Chen, Chen-Ni...
Materials Science and Engineering: A.  613 (2014)  - p. 372-378 , 2014
 
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9

Investigation of electromigration reliability of redistribu..:

Kao, Chin-Li ; Chen, Tei-Chen ; Lai, Yi-Shao.
Microelectronics Reliability.  54 (2014)  11 - p. 2471-2478 , 2014
 
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10

The influence of Pd on the interfacial reactions between th..:

Lin, Yu-Wei ; Ke, Wun-Bin ; Wang, Ren-You...
Surface and Coatings Technology.  231 (2013)  - p. 599-603 , 2013
 
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11

Ball Impact Reliability of Zn-Sn High-Temperature Solder Jo..:

Song, Jenn-Ming ; Lin, Meng-Ju ; Hsieh, Kun-Hung...
Journal of Electronic Materials.  42 (2013)  9 - p. 2813-2821 , 2013
 
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12

Electrorecrystallization of Metal Alloy:

Chiu, Ying-Ta ; Lin, Kwang-Lung ; Wu, Albert T....
Journal of Alloys and Compounds.  549 (2013)  - p. 190-194 , 2013
 
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15

The Pd distribution and Cu flow pattern of the Pd-plated Cu..:

Lin, Yu-Wei ; Wang, Ren-You ; Ke, Wun-Bin...
Materials Science and Engineering: A.  543 (2012)  - p. 152-157 , 2012
 
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