Search for persons
X
?
2024 IEEE 42nd VLSI Test Symposium (VTS) ,
2
Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Desig..:
, In:
?
2023 IEEE International Test Conference (ITC) ,
3
Preventing Single-Event Double-Node Upsets by Engineering C..:
, In:
?
2023 IEEE Biomedical Circuits and Systems Conference (BioCAS) ,
4
An Ultrathin and Adhesive Skin-Compliant Electrode Patch co..:
, In:
?
Lecture Notes in Electrical Engineering; Proceeding of the 3rd International Conference on Electronics, Biomedical Engineering, and Health Informatics ,
5
Heart Abnormality Classification with Power Spectrum Featur..:
, In:
?
2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
7
Radiation-Harden RISC Processor for Micro-Satellites in Sta..:
, In:
?
Proceedings of the Great Lakes Symposium on VLSI 2017 ,
9
Radiation-Hardened Designs for Soft-Error-Rate Reduction by..:
, In:
?
Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI ,
14