Cho, Moonju
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3

Hot-carrier analysis on nMOS Si FinFETs with solid source d..:

, In: 2016 IEEE International Reliability Physics Symposium (IRPS),
Chasin, Adrian ; Franco, Jacopo ; Ritzenthaler, Romain... - p. 4B-4-1-4B-4-6 , 2016
 
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4

Comparison of NBTI aging on adder architectures and ring os..:

Kükner, Halil ; Weckx, Pieter ; Morrison, Sébastien...
Microprocessors and Microsystems.  39 (2015)  8 - p. 1039-1051 , 2015
 
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5

(Invited) Reliability of SiGe Channel MOS:

Franco, Jacopo ; Kaczer, Ben ; Mitard, Jerome...
ECS Transactions.  50 (2013)  9 - p. 177-195 , 2013
 
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12

Dopant Penetration Behavior of B-Doped P[sup +] Polycrystal..:

Lee, Chihoon ; Park, Jaehoo ; Cho, Moonju...
Electrochemical and Solid-State Letters.  9 (2006)  3 - p. G84 , 2006
 
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14

Fabrication of HfO[sub 2] Thin-Film Capacitors with a Polyc..:

Lee, Suk Woo ; Hong, Sug Hun ; Park, Jaehoo...
Electrochemical and Solid-State Letters.  8 (2005)  9 - p. F32 , 2005
 
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