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Chohan, Talha
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1

Efficient Characterization Methodology for Low-Frequency No..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Pirro, Luca ; Chohan, Talha ; Liebscher, Philipp... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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2

Spike-Time Dependent Plasticity in HfO₂-Based Ferroelectric..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Masud Rana, Sk ; Roy, Sourodeep ; Lederer, Maximilian... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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3

Demonstration of Large Polarization in Si-doped HfO2 Metal–..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Hsuen, Jing-Hua ; Lederer, Maximillian ; Kerkhofs, Lars... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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4

Impact of High-K Deposition Process on the Noise Immunity o..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Raffel, Yannick ; Olivo, Ricardo ; Lederer, Maximilian... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

1F-1T Array: Current Limiting Transistor Cascoded FeFET Mem..:

Sk, Masud Rana ; Thunder, Sunanda ; Müller, Franz...
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 424-429 , 2023
Link: https://doi.org/10.1109/..
 
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6

Interfacial Layer Engineering to Enhance Noise Immunity of ..:

, In: 2022 International Conference on IC Design and Technology (ICICDT),
Raffel, Yannick ; Thunder, Sunanda ; Lederer, Maximilian... - p. 8-11 , 2022
Link: https://doi.org/10.1109/..
 
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7

Implication of Self-Heating Effect on Device Reliability Ch..:

Chohan, Talha ; Zhao, Zhixing ; Lehmann, Steffen...
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 387-395 , 2022
Link: https://doi.org/10.1109/..
 
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8

Synergistic Approach of Interfacial Layer Engineering and R..:

Raffel, Yannick ; De, Sourav ; Lederer, Maximilian...
ACS Applied Electronic Materials.  4 (2022)  11 - p. 5292-5300 , 2022
Link: https://doi.org/10.1021/..
 
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9

SOTF-BTI - an S-Parameters based on-the-fly Bias Temperatur..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Chohan, Talha ; Slesazeck, Stefan ; Krause, Gernot... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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10

IIRW 2019 Discussion Group II: Reliability for Aerospace Ap..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Scharlotta, Jean-Yean ; Kotov, Alexander ; Zambelli, Cristian... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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11

Impact of BTI Stress on RF Small Signal Parameters of FDSOI..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Chohan, Talha ; Slesazeck, Stefan ; Trommer, Jens... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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12

Repellency, Toxicity, Gene Expression Profiling and In Sili..:

Chohan, Talha ; Chohan, Tahir ; Zhou, Lijun...
Toxins.  10 (2018)  11 - p. 425 , 2018
Link: https://doi.org/10.3390/..
 
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13

Sustainable agriculture through rhizosphere bacteria for pl..:

Hussain, Muhammad Qasim ; Fatima, Seerat ; Nawaz, Aiman...
International Journal of Applied and Experimental Biology.  , 2024
Link: https://doi.org/10.56612..
 
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14

Integrated computational approaches for designing potent py..:

Habib, Iffat ; Chohan, Tahir Ali ; Chohan, Talha Ali...
Computational Biology and Chemistry.  108 (2024)  - p. 108003 , 2024
Link: https://doi.org/10.1016/..
 
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15

Molecular modeling of novel 2-aminopyridine derivatives as ..:

Munir, Nadia ; Chohan, Tahir Ali ; Qayyum, Aisha...
Journal of Biomolecular Structure and Dynamics.  , 2024
Link: https://doi.org/10.1080/..
 
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