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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-Al..:
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Research Handbook on Poverty and Inequality ,
4
Consistent, dense measures of inequality using grouped data..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
8
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
11
Investigating of SER in 28 nm FDSOI-Planar and Comparing wi..:
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2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
15