Choi, Jaehee
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1

Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Choi, Jaehee... - p. 1-5 , 2024
 
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2

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-Al..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Choi, Jaehee... - p. 1-6 , 2024
 
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3

Study on the Prediction of Debris Flow Risk Using LS-RAPID:

Kim, Namgyun ; Choi, Jaehee ; Jun, Byonghee
Journal of the Korean Society of Hazard Mitigation.  23 (2023)  1 - p. 73-82 , 2023
 
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4

Consistent, dense measures of inequality using grouped data..:

, In: Research Handbook on Poverty and Inequality,
Galbraith, James ; Choi, Jaehee - p. 224-244 , 2023
 
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6

The antidiabetic drug teneligliptin induces vasodilation vi..:

Li, Hongliang ; An, Jin Ryeol ; Park, Minju...
European Journal of Pharmacology.  935 (2022)  - p. 175305 , 2022
 
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8

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Jo, Jeongmin... - p. 1-4 , 2020
 
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9

Rockfall Risk Analysis Based on Precise Topography using UA:

Choi, Jaehee ; Kim, Namgyun ; Choe, Bongjin.
Journal of the Korean Society of Hazard Mitigation.  20 (2020)  4 - p. 63-73 , 2020
 
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10

The consequences of economic inequality for presidential el..:

Galbraith, James ; Choi, Jaehee
Structural Change and Economic Dynamics.  53 (2020)  - p. 86-98 , 2020
 
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11

Investigating of SER in 28 nm FDSOI-Planar and Comparing wi..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Jo, Jeongmin... - p. 1-5 , 2020
 
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13

Analysis of furan and monosaccharides in various coffee bea..:

Kim, Yu-Jin ; Choi, Jaehee ; Lee, Gaeun.
Journal of Food Science and Technology.  58 (2020)  3 - p. 862-869 , 2020
 
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14

The Politics of American Inequality:

Galbraith, James ; Choi, Jaehee
Intereconomics.  55 (2020)  1 - p. 63-64 , 2020
 
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15

Impact of BEOL Design on Self-heating and Reliability in Hi..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Choi, Jaehee ; Monga, Udit ; Park, Yonghee... - p. 1-4 , 2019
 
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