Chou, Emin
20  results:
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1

Avalanche Photodiodes With Composite Charge-Layers for Low ..:

Naseem ; Ahmad, Zohauddin ; Liao, Yan-Min...
IEEE Journal of Selected Topics in Quantum Electronics.  28 (2022)  2: Optical Detectors - p. 1-10 , 2022
 
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2

High-reliability, High-performance 25 Gb/s Directly Modulat..:

Huang, Jack Jia-Sheng ; Huang, S.C. ; Wu, NiYeh...
Applied Science and Innovative Research.  5 (2021)  1 - p. p56 , 2021
 
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5

Demonstration of Improved Immunity to Residual Facet Reflec..:

, In: 2020 Opto-Electronics and Communications Conference (OECC),
 
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6

Humidity Degradation Study of Mesa-type Avalanche Photodiod..:

Huang, Jack Jia-Sheng ; Chang, H.S. ; Chou, Emin..
Applied Science and Innovative Research.  4 (2020)  4 - p. p9 , 2020
 
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7

Reliability Challenges of Nanoscale Avalanche Photodiodes f..:

, In: Springer Series in Optical Sciences; Optics, Photonics and Laser Technology 2018,
Huang, Jack Jia-Sheng ; Jan, Yu-Heng ; Chang, H. S.... - p. 143-167 , 2019
 
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11

High-reliability, High-performance 25 Gb/s Directly Modulat..:

Huang, Jack Jia-Sheng ; Huang, S.C ; Wu, NiYeh...
http://www.scholink.org/ojs/index.php/asir/article/view/3708/3811.  , 2021
 
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12

Humidity Degradation Study of Mesa-type Avalanche Photodiod..:

Huang, Jack Jia-Sheng ; Chang, H.S ; Chou, Emin..
http://www.scholink.org/ojs/index.php/asir/article/view/3333/3464.  , 2020
 
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13

Nanoscale Nucleation and Growth of Non-Stoichiometric V-Sha..:

Huang, Jack Jia-Sheng ; Shyu, Chung ; Jan, Yu-Heng...
http://www.scholink.org/ojs/index.php/asir/article/view/946/1047.  , 2017
 
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15

Swift Reliability Test Methodology of 100G High-Speed, Ener..:

Huang, Jack Jia-Sheng ; Jan, Yu-Heng ; Chang, Jesse...
https://redfame.com/journal/index.php/set/article/view/1727/1801.  , 2016
 
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