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2020 Opto-Electronics and Communications Conference (OECC) ,
5
Demonstration of Improved Immunity to Residual Facet Reflec..:
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Springer Series in Optical Sciences; Optics, Photonics and Laser Technology 2018 ,
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Reliability Challenges of Nanoscale Avalanche Photodiodes f..:
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2019 IEEE Photonics Conference (IPC) ,
8