Chou, Pei-Ting
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2

List of contributors:

, In: Nitride Semiconductor Light-Emitting Diodes (LEDs),
Ajay, Akhil ; Arefin, Nazmul ; Bertazzi, Francesco... - p. xi-xiii , 2018
 
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Reliability of nitride LEDs:

, In: Nitride Semiconductor Light-Emitting Diodes (LEDs),
Chen, Tzung-Te ; Dai, Chun-Fan ; Wang, Chien-Ping... - p. 441-453 , 2018
 
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Evaluation of temperature distribution of LED module:

Fu, Han-Kuei ; Wang, Chien-Ping ; Chiang, Hsin-Chien...
Microelectronics Reliability.  53 (2013)  4 - p. 554-559 , 2013
 
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The evaluation for the chromatic characteristics of LED mod..:

Fu, Han Kuei ; Peng, Yi Ping ; Ying, Shang Pin...
Microelectronics Reliability.  53 (2013)  12 - p. 1916-1921 , 2013
 
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Accelerated Degradation of High Power Light-Emitting Diode ..:

Yang, Shih Chun ; Lin, Pang ; Fu, Han Kuei...
Japanese Journal of Applied Physics.  50 (2011)  3R - p. 034301 , 2011
 
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Accelerated Degradation of High Power Light-Emitting Diode ..:

Yang, Shih Chun ; Lin, Pang ; Fu, Han Kuei...
Japanese Journal of Applied Physics.  50 (2011)  3R - p. 034301 , 2011
 
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Empirical Study of Proposed Meltdown Attack Implementation ..:

, In: 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS),
 
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