Chu, Wei-Cheng
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1

Case Study For STI-LDNMOS Burned During HCI Stress to Passi..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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3

Controlling the Morphology and Interface of the Perovskite ..:

Huang, Shih-Han ; Tian, Kuo-Yu ; Huang, Hung-Che...
ACS Applied Materials & Interfaces.  12 (2020)  23 - p. 26041-26049 , 2020
 
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5

Investigation of Saturated Drain Current Change Phases For ..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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12

The Levels of Fashion Literacy for Fashion Design-related D..:

CHIU, Shu-Ping ; TU, Jui-Che ; CHU, Wei-Cheng.
International Journal of Affective Engineering.  13 (2014)  3 - p. 205-215 , 2014
 
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