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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
1
BEOL Compatible Extremely Scaled Bilayer ITO/IGZO Channel F..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
2
Sub-10nm Ultra-thin ZnO Channel FET with Record-High 561 µA..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
3
Extremely- Scaled Channel Thickness ZnO FET with High Mobil..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
6
Back-End-of-Line-Compatible Anneal-Free Ferroelectric Field..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
7
Overcoming Negative nFET VTH by Defect-Compensated Low-Ther..:
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2023 International Electron Devices Meeting (IEDM) ,
9
First Demonstration of HZO-LNOI Integrated Ferroelectric El..:
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2023 International Electron Devices Meeting (IEDM) ,
13
Negative-U Defect Passivation in Oxide-Semiconductor by Cha..:
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
15