Claeys, Cor
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2

RTS Noise Characterization of Trap Properties in InGaAs nFi..:

Xiao, Xiaolei ; He, Liang ; Chen, Hua...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3496-3503 , 2023
 
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6

Tunnel-FET Evolution and Applications for Analog Circuits:

Agopian, Paula Ghedini Der ; Martino, Joao A. ; Simoen, Eddy..
Journal of Integrated Circuits and Systems.  17 (2022)  2 - p. 1-7 , 2022
 
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7

Guest Editors' Words:

Claeys, Cor ; Martino, João A.
Journal of Integrated Circuits and Systems.  17 (2022)  2 - p. 1-2 , 2022
 
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8

The Low-Frequency Noise Behavior of Advanced Logic and Memo..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
 
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15

Analog Performance of SOI nMuGFETs with Different TiN Gate ..:

Galeti, Milene ; Rodrigues, Michele ; Collaert, Nadine...
Journal of Integrated Circuits and Systems.  6 (2020)  2 - p. 102-106 , 2020
 
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