E-LIB Suche - Ergebnisse für: Colinge, J.P.

1

Comparative experimental study of junctionless and inversio..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),

Bosch, D. ; Colinge, J.P. ; Lugo, J.... - p. 126-127 , 2020

Link: https://doi.org/10.1109/..

2

Novel fine-grain back-bias assist techniques for 3D-monolit..:

Bosch, D. ; Garros, X. ; Makosiej, A....
Solid-State Electronics. 168 (2020) - p. 107720 , 2020

Link: https://doi.org/10.1016/..

3

All-operation-regime characterization and modeling of drain..:

, In: 2020 IEEE Symposium on VLSI Technology,

Bosch, D. ; Colinge, J.P. ; Ghibaudo, G.... - p. 1-2 , 2020

Link: https://doi.org/10.1109/..

4

Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),

Bosch, D. ; Andrieu, F. ; Ciampolini, L.... - p. 1-2 , 2019

Link: https://doi.org/10.1109/..

5

New prospects on high on-current and steep subthreshold slo..:

Diaz Llorente, C. ; Colinge, J.-P. ; Martinie, S....
Solid-State Electronics. 159 (2019) - p. 26-37 , 2019

Link: https://doi.org/10.1016/..

6

Back-bias impact on variability and BTI for 3D-monolithic 1..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),

Bosch, D. ; Andrieu, F. ; Garros, X.... - p. 1-4 , 2019

Link: https://doi.org/10.1109/..

7

Laser Processing For 3D Junctionless Transistor Fabrication:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),

Bosch, D. ; Alba, P. Acosta ; Kerdiles, S.... - p. 1-3 , 2019

Link: https://doi.org/10.1109/..

8

New insights on SOI Tunnel FETs with low-temperature proces..:

Diaz Llorente, C. ; Le Royer, C. ; Batude, P....
Solid-State Electronics. 144 (2018) - p. 78-85 , 2018

Link: https://doi.org/10.1016/..

9

Silicon-on-insulator (SOI) junctionless transistors:

, In: Silicon-On-Insulator (SOI) Technology,

Colinge, J.P. - p. 167-194 , 2014

Link: https://doi.org/10.1533/..

10

Contributor contact details:

, In: Silicon-On-Insulator (SOI) Technology,

Kononchuk, O. ; Nguyen, B.-Y. ; Moriceau, H.... - p. xi-xiii , 2014

Link: https://doi.org/10.1016/..

11

Impact ionization induced dynamic floating body effect in j..:

Yu, R. ; Nazarov, A.N. ; Lysenko, V.S....
Solid-State Electronics. 90 (2013) - p. 28-33 , 2013

Link: https://doi.org/10.1016/..

12

Mobility and screening effect in heavily doped accumulation..:

Goto, Ken-Ichi ; Yu, Tsung-Hsing ; Wu, Jeff..
Applied Physics Letters. 101 (2012) 7 - p. 073503 , 2012

Link: https://doi.org/10.1063/..

13

Semiconductor-on-insulator materials for nanoelectronics ap..

Engineering materials

Nazarov, Alexei ; Colinge, J.-P. ; Balestra, Francis... , 2011

Copies: Zentrale: a elt 020.2 m/526

14

Field-effect mobility extraction in nanowire field-effect t..:

Nazarov, A. N. ; Ferain, I. ; Dehdashti Akhavan, N....
Applied Physics Letters. 99 (2011) 7 - p. , 2011

Link: https://doi.org/10.1063/..

15

Random telegraph-signal noise in junctionless transistors:

Nazarov, A. N. ; Ferain, I. ; Akhavan, N. Dehdashti...
Applied Physics Letters. 98 (2011) 9 - p. , 2011

Link: https://doi.org/10.1063/..