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Copetti, S.
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1

CUIDA'L: un ensayo clínico que evaluará la eficacia de una ..:

Vinyoles, E. ; Copetti, S. ; Cabezas, C....
Atención Primaria.  27 (2001)  1 - p. 49-53 , 2001
Link: https://doi.org/10.1016/..
 
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2

Analyzing the Use of Temperature to Facilitate Fault Propag..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Copetti, T. S. ; Chordia, A. ; Fieback, M.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

A DfT Strategy for Guaranteeing ReRAM's Quality after Manuf..:

Copetti, T. S. ; Fieback, M. ; Gemmeke, T...
Journal of Electronic Testing.  40 (2024)  2 - p. 245-257 , 2024
Link: https://doi.org/10.1007/..
 
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4

Evaluating a New RRAM Manufacturing Test Strategy:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Copetti, T. S. ; Castelnuovo, A. ; Gemmeke, T.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Exploring an On-Chip Sensor to Detect Unique Faults in RRAM:

, In: 2022 IEEE 23rd Latin American Test Symposium (LATS),
Copetti, T. S. ; Nilovic, M. ; Fieback, M.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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6

Evaluating the Impact of Process Variation on RRAMs:

, In: 2021 IEEE 22nd Latin American Test Symposium (LATS),
Brum, E. ; Fieback, M. ; Copetti, T. S.... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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7

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

, In: VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things; IFIP Advances in Information and Communication Technology,
Copetti, Thiago S. ; Medeiros, Guilherme C. ; Poehls, Letícia M. B.. - p. 22-45 , 2019
Link: https://doi.org/10.1007/..
 
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8

A review on acoustic and skid resistance solutions for road..:

Copetti Callai S ; Sangiorgi C
info:eu-repo/semantics/altIdentifier/wos/WOS:000636169800001.  , 2021
Link: http://hdl.handle.net/11..
 
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9

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

Copetti, Thiago, S ; Medeiros, Guilherme, C ; Poehls, Letícia.
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-15663-3_2.  , 2017
Link: https://inria.hal.scienc..
 
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10

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

Copetti, Thiago, S ; Medeiros, Guilherme, C ; Poehls, Letícia.
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-15663-3_2.  , 2017
Link: https://inria.hal.scienc..
 
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11

A new record of Tayassuidae (Mammalia: Cetartiodactyla) fro..:

COPETTI, PAULA L. ; PARISI-DUTRA, RODRIGO ; DA-ROSA, ÁTILA A.S..
Anais da Academia Brasileira de Ciências.  93 (2021)  suppl 2 - p. , 2021
Link: https://doi.org/10.1590/..
 
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12

Review of Manufacturing Process Defects and Their Effects o..:

Poehls, L. M. Bolzani ; Fieback, M. C. R. ; Hoffmann-Eifert, S....
Journal of Electronic Testing.  37 (2021)  4 - p. 427-437 , 2021
Link: https://doi.org/10.1007/..
 
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13

EAN guideline on palliative care of people with severe, pro..:

Solari, A. ; Giordano, A. ; Sastre‐Garriga, J....
European Journal of Neurology.  27 (2020)  8 - p. 1510-1529 , 2020
Link: https://doi.org/10.1111/..
 
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14

Effects of the addition of quantitative apparent diffusion ..:

Moraes, Marcia Oliveira ; Roman, Diego H. H. ; Copetti, Josenel...
World Journal of Urology.  38 (2019)  4 - p. 981-991 , 2019
Link: https://doi.org/10.1007/..
 
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15

Different regimen of natalizumab treatment in multiple scle..:

Ruggieri, S. ; Ianniello, A. ; De Giglio, L....
Journal of the Neurological Sciences.  405 (2019)  - p. 338-339 , 2019
Link: https://doi.org/10.1016/..
 
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