Cosme-Bolanos, Ismael
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1

Ultrathin PECVD epitaxial Si solar cells on glass via low-t..:

Cariou, Romain ; Chen, Wanghua ; Cosme-Bolanos, Ismael...
Progress in Photovoltaics: Research and Applications.  24 (2016)  8 - p. 1075-1084 , 2016
 
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Comparison of Doping of Gey Si1-y:H (y>0.95) Films Deposite..:

Ismael Cosme Bolaños ; ANDREY KOSAREV ; FRANCISCO TEMOLTZI AVILA
citation:Cosme, Ismael, et al., (2012), Comparison of Doping of Gey Si1-y:H (y>0.95) Films Deposited by Low Frequency PECVD at High (300°C) and Low (160°C) Temperatures, Mater. Res. Soc. Symp. Proc, Vol. 1426:295-299.  , 2012
 
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Noise in micro-bolometers with silicon-germanium thermo-sen..:

ANDREY KOSAREV ; MARIO MORENO MORENO ; ALFONSO TORRES JACOME..
citation:Kosarev, A., et al., (2010). Noise in micro-bolometers with silicon-germanium thermo-sensing layer, Thin Solid Films, (518): 3310–3312.  , 2010
 
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5

Noise spectra of Six Gey Bz:H thermo-sensing films for micr..:

ANDREY KOSAREV ; ISMAEL COSME BOLAÑOS ; ALFONSO TORRES JACOME
citation:Kosarev, A., et al., (2009). Noise spectra of Six Gey Bz:H films for micro-bolometers, Mater. Res. Soc. Symp. Proc. Vol. 1153 (A19-05): 1-6.  , 2009
 
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7

Noise in different micro-bolometer configurations with Sili..:

MARIO MORENO MORENO ; ANDREY KOSAREV ; ALFONSO TORRES JACOME.
citation:Moreno-Moreno, M., et al., (2008). Noise in different micro-bolometer configurations with Silicon-Germanium thermosensing layer, Mater. Res. Soc. Symp. Proc. Vol. 1066 (A18-05): 1-6.  , 2008
 
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9

Influence of the composition of glass substrates on CH3NH3P..:

, In: 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE),
 
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12

Phase Singularity in Random Gold Metasurface for Refractive..:

Cuanalo-Fernández, Juan P. ; Korneev, Nikolai ; Cosme, Ismael...
The Journal of Physical Chemistry C.  128 (2024)  27 - p. 11372-11381 , 2024
 
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15

In-depth study of the effect of annealing temperature on th..:

Montaño, Beatriz ; Diaz, José Juan ; Koudriavtsev, Iouri...
Journal of Materials Science: Materials in Electronics.  34 (2023)  12 - p. , 2023
 
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