I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Costina, Mircea I.
30
results:
Search for persons
X
Sorted by: Relevance
Sorted by: Year
?
1
Roost Sites and Communal Behavior of Andean Condors in Chil..:
Herrmann, Thora Martina
;
Costina, Mircea I.
;
Costina, Alina M. Aron
Geographical Review. 100 (2010) 2 - p. 246-262 , 2010
Link:
https://doi.org/10.1111/..
?
2
ROOST SITES AND COMMUNAL BEHAVIOR OF ANDEAN CONDORS IN CHIL:
HERRMANN, THORA MARTINA
;
COSTINA, MIRCEA I.
;
COSTINA, ALINA M. ARON
Geographical Review. 100 (2010) 2 - p. 246-262 , 2010
Link:
https://www.jstor.org/st..
?
3
On the Impact of Strained PECVD Nitride Layers on Oxide Pre..:
Kissinger, G.
;
Kot, D.
;
Costina, I.
.
ECS Journal of Solid State Science and Technology. 8 (2019) 9 - p. N125-N133 , 2019
Link:
https://doi.org/10.1149/..
?
4
Processing and integration of graphene in a 200 mm wafer Si..:
Lisker, M.
;
Lukosius, M.
;
Fraschke, M.
...
Microelectronic Engineering. 205 (2019) - p. 44-52 , 2019
Link:
https://doi.org/10.1016/..
?
5
Graphene Synthesis and Processing on Ge Substrates:
Lupina, G.
;
Lukosius, M.
;
Lippert, G.
...
ECS Journal of Solid State Science and Technology. 6 (2017) 5 - p. M55-M59 , 2017
Link:
https://doi.org/10.1149/..
?
6
Resolving the nanostructure of plasma-enhanced chemical vap..:
Klingsporn, M.
;
Kirner, S.
;
Villringer, C.
...
Journal of Applied Physics. 119 (2016) 22 - p. , 2016
Link:
https://doi.org/10.1063/..
?
7
Growth of ScN(111) on Sc2O3(111) for GaN integration on Si(..:
Sana, P.
;
Tetzner, H.
;
Dabrowski, J.
...
Journal of Applied Physics. 120 (2016) 13 - p. , 2016
Link:
https://doi.org/10.1063/..
?
8
Enhanced leakage current behavior of Sr2Ta2O7−x/SrTiO3 bila..:
Kaynak, C. Baristiran
;
Lukosius, M.
;
Costina, I.
...
Thin Solid Films. 519 (2011) 17 - p. 5734-5739 , 2011
Link:
https://doi.org/10.1016/..
?
9
Metastable surface oxide on CoGa(100): Structure and stabil..:
Vlad, A.
;
Stierle, A.
;
Marsman, M.
...
Physical Review B. 81 (2010) 11 - p. , 2010
Link:
https://doi.org/10.1103/..
?
10
Corrosion-resistant metal layers from a CMOS process for bi..:
Birkholz, M.
;
Ehwald, K.-E.
;
Wolansky, D.
...
Surface and Coatings Technology. 204 (2010) 12-13 - p. 2055-2059 , 2010
Link:
https://doi.org/10.1016/..
?
11
Dielectric constant and leakage of BaZrO3 films:
Łupina, G.
;
Dąbrowski, J.
;
Dudek, P.
...
Applied Physics Letters. 94 (2009) 15 - p. , 2009
Link:
https://doi.org/10.1063/..
?
12
Driving mechanisms for the formation of nanocrystals by ann..:
Peibst, R.
;
Dürkop, T.
;
Bugiel, E.
...
Physical Review B. 79 (2009) 19 - p. , 2009
Link:
https://doi.org/10.1103/..
?
13
Ge integration on Si via rare earth oxide buffers: From MBE..:
Schroeder, T.
;
Giussani, A.
;
Muessig, H.-J.
...
Microelectronic Engineering. 86 (2009) 7-9 - p. 1615-1620 , 2009
Link:
https://doi.org/10.1016/..
?
14
PE-CVD fabrication of germanium nanoclusters for memory app..:
Dürkop, T.
;
Bugiel, E.
;
Costina, I.
...
Materials Science and Engineering: B. 147 (2008) 2-3 - p. 213-217 , 2008
Link:
https://doi.org/10.1016/..
?
15
Investigation of atomic vapour deposited TiN/HfO2/SiO2 gate..:
Wenger, Ch.
;
Lukosius, M.
;
Costina, I.
...
Microelectronic Engineering. 85 (2008) 8 - p. 1762-1765 , 2008
Link:
https://doi.org/10.1016/..
1-15