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Couet, Sebastien
106  results:
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1

Spin–Orbit Torque Vector Quantification in Nanoscale Magnet..:

Vudya Sethu, Kiran Kumar ; Yasin, Farrukh ; Swerts, Johan...
ACS Nano.  , 2024
Link: https://doi.org/10.1021/..
 
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2

Enhanced SOT Efficiency in Pt/Co Systems with a NiO Interla..:

, In: 2024 IEEE International Magnetic Conference - Short papers (INTERMAG Short papers),
Wijshoff, Michelle ; Carpenter, Robert ; Talmelli, Giacomo... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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3

A quantum sensing metrology for magnetic memories:

Borràs, Vicent J. ; Carpenter, Robert ; Žaper, Liza...
npj Spintronics.  2 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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4

Design-for-Test for Intermittent Faults in STT-MRAMs:

, In: 2024 IEEE European Test Symposium (ETS),
Yuan, Sicong ; Yaldagard, Mohammad Amin ; Xun, Hanzhi... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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5

Novel Cross-Point Architecture utilizing Distributed Diode ..:

, In: 2024 IEEE International Memory Workshop (IMW),
Ravsher, Taras ; Fantini, Andrea ; Trivedi, Kruti... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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6

Progress in Spin Logic Devices Based on Domain-Wall Motion:

Vermeulen, Bob Bert ; Sorée, Bart ; Couet, Sebastien..
Micromachines.  15 (2024)  6 - p. 696 , 2024
Link: https://doi.org/10.3390/..
 
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7

Impact of net magnetization on spin–orbit torque switching ..:

Kateel, Vaishnavi ; Monteiro, Maxwel Gama ; Jeong, Seyeob...
Applied Physics Letters.  124 (2024)  6 - p. , 2024
Link: https://doi.org/10.1063/..
 
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8

Hard Error Correction in STT-MRAM:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Hemaram, Surendra ; Tahoori, Mehdi B ; Catthoor, Francky... - p. 752-757 , 2024
Link: https://doi.org/10.1109/..
 
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9

Device-Aware Test for Back-Hopping Defects in STT-MRAMs:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Yuan, Sicong ; Taouil, Mottaqiallah ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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10

MTJ degradation in multi-pillar SOT-MRAM with selective wri..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Van Beek, Simon ; Cai, Kaiming ; Fan, Kaiquan... - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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11

Impact of SOT & STT stress on MTJ degradation in SOT-MRAM:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
Van Beek, Simon ; Kateel, Vaishnavi ; Cai, Kaiming... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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12

NPN Si/SiGe memory selector with non-linearity>105 and ON-c..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Hiblot, Gaspard ; Ravsher, Taras ; Loo, Roger... - p. 164-167 , 2023
Link: https://doi.org/10.1109/..
 
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13

Distributions of easy axes and reversal processes in patter..:

Frost, William ; Carpenter, Robert ; Couet, Sebastien..
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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14

Spin-orbit torque MRAM for ultrafast cache and neuromorphic..:

, In: 2023 IEEE International Memory Workshop (IMW),
Rao, Siddharth ; Cai, Kaiming ; Talmelli, Giacomo... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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15

Device Aware Diagnosis for Unique Defects in STT-MRAMs:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Aouichi, Ahmed ; Yuan, Sicong ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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