E-LIB Suche - Ergebnisse für: Coulié, K.

1

Analysis of Conductance Variability in RRAM for Accurate Ne..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Aziza, H. ; Postel-Pellerin, J. ; Fieback, M.... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

2

Investigation of Single Event Effects in a Resistive RAM Me..:

Coulié, K. ; Aziza, H. ; Rahajandraibe, W.
Journal of Electronic Testing. 39 (2023) 3 - p. 275-288 , 2023

Link: https://doi.org/10.1007/..

3

Advanced TCAD Simulation of Tunnel Oxide Degradation for EE..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),

Matteo, F. ; Simola, R. ; Postel-Pellerin, J.. - p. 764-768 , 2022

Link: https://doi.org/10.1109/..

4

Reaching ultra-high vacuum for a large vacuum vessel in an ..:

Sabulsky, D. O. ; Zou, X. ; Junca, J....
E3S Web of Conferences. 357 (2022) - p. 05001 , 2022

Link: https://doi.org/10.1051/..

5

1T-NOR Flash memory after endurance degradation: An advance..:

Matteo, F. ; Simola, R. ; Postel-Pellerin, J..
Microelectronics Reliability. 138 (2022) - p. 114621 , 2022

Link: https://doi.org/10.1016/..

6

Portable Resistive Plate Chambers for Muography in confined..:

Gamage, R.M.I.D ; Basnet, Samip ; Cortina Gil, Eduardo...
E3S Web of Conferences. 357 (2022) - p. 01001 , 2022

Link: https://doi.org/10.1051/..

7

Preface:

Coulié, Karine ; Micolau, Gilles ; Lázaro Roche, Ignacio...
E3S Web of Conferences. 357 (2022) - p. 00001 , 2022

Link: https://doi.org/10.1051/..

8

Near subsurface density reconstruction by full waveform inv..:

Didier, Quentin ; Arhab, Slimane ; Mesgouez, Arnaud...
E3S Web of Conferences. 357 (2022) - p. 03001 , 2022

Link: https://doi.org/10.1051/..

9

Vestale loop: a robust, versatile, reliable and remote cont..:

Dezord, Clément ; Micolau, Gilles ; Abbas, Chahine...
E3S Web of Conferences. 357 (2022) - p. 02001 , 2022

Link: https://doi.org/10.1051/..

10

Isolation and initial characterization of microorganisms fr..:

Galès, Grégoire ; Erauso, Gaël ; Canhiac, Isabelle...
E3S Web of Conferences. 357 (2022) - p. 04001 , 2022

Link: https://doi.org/10.1051/..

11

Particle Identification and Tracking by the Use of a Pixel-..:

Coulié, K. ; Rahajandraibe, W. ; Ottaviani, L....
EPJ Web of Conferences. 253 (2021) - p. 09007 , 2021

Link: https://doi.org/10.1051/..

12

AC stress reliability study of a new high voltage transisto..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Locati, J. ; Della-Marca, V. ; Rivero, C.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

13

AC stress reliability study on a novel vertical MOS transis..:

Locati, J. ; Della Marca, V. ; Rivero, C....
Microelectronics Reliability. 114 (2020) - p. 113810 , 2020

Link: https://doi.org/10.1016/..

14

On the Improvement of VCO Based Matrix Particle Detector fo..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Coulie, K. ; Rahajandraibe, W. ; Ottaviani, Laurent - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

15

Inductan: a simple, robust and fast numerical tool to evalu..:

Micolau, Gilles ; Pozzo Di Borgo, Elisabeth ; Coulié, K...
E3S Web of Conferences. 88 (2019) - p. 06003 , 2019

Link: https://doi.org/10.1051/..