Search for persons
X
?
2024 IEEE 25th Latin American Test Symposium (LATS) ,
1
Analysis of Conductance Variability in RRAM for Accurate Ne..:
, In:
?
2022 IEEE 4th International Conference on Dielectrics (ICD) ,
3
Advanced TCAD Simulation of Tunnel Oxide Degradation for EE..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
12
AC stress reliability study of a new high voltage transisto..:
, In:
?
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
14