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Crespo Yepes, Albert
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1

Experimental Verification of Memristor-Based Material Impli..:

Maestro-Izquierdo, Marcos ; Martin-Martinez, Javier ; Crespo Yepes, Albert...
IEEE Transactions on Emerging Topics in Computing.  7 (2019)  4 - p. 545-552 , 2019
Link: https://doi.org/10.1109/..
 
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2

On the Aging of OTFTs and Its Impact on PUFs Reliability:

Porti, Marc ; Palau, Gerard ; Crespo-Yepes, Albert...
Micromachines.  15 (2024)  4 - p. 443 , 2024
Link: https://doi.org/10.3390/..
 
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3

Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gat..:

Valdivieso, Carlos ; Crespo Yepes, Albert ; Miranda, R...
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2023
Link: https://ddd.uab.cat/reco..
 
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4

Sistema industrial de resposta ràpida pel monitoratge de pr..:

Companys Garcia, Guillem ; Crespo Yepes, Albert ; Universitat Autònoma de Barcelona. Escola d'Enginyeria
https://ddd.uab.cat/record/282734.  , 2023
Link: https://ddd.uab.cat/reco..
 
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5

Exploitation of OTFTs variability for PUFs implementation a..:

Claramunt, Sergi ; Palau, Gerard ; Arnal Rus, August...
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2023
Link: https://ddd.uab.cat/reco..
 
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6

Resistive switching like-behavior in FD-SOI Ω-gate transist..:

Valdivieso, Carlos ; Rodríguez Martínez, Rosana ; Crespo Yepes, Albert..
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2023
Link: https://ddd.uab.cat/reco..
 
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7

Random Telegraph Noise and Bias Temperature Instabilities s..:

Pedreira Rincon, Gerard ; Martin Martinez, Javier ; Crespo Yepes, Albert...
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2023
Link: https://ddd.uab.cat/reco..
 
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8

Beneficial Role of Noise in Hf-based Memristors:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Rodriguez, Rosana ; Martin-Martinez, Javier ; Salvador, Emili... - p. 975-979 , 2022
Link: https://doi.org/10.1109/..
 
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9

Stochastic resonance effect in binary STDP performed by RRA..:

, In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO),
Salvador, Emili ; Rodriguez, Rosana ; Martin-Martinez, Javier... - p. 449-452 , 2022
Link: https://doi.org/10.1109/..
 
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10

CMOS inverter performance degradation and its correlation w..:

Crespo Yepes, Albert ; Nasarre, C ; Garsot, N...
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2022
Link: https://ddd.uab.cat/reco..
 
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11

Beneficial role of noise in Hf-based memristors:

Rodriguez, Rosana ; Martin Martinez, Javier ; Salvador, Emili...
https://ieeexplore.ieee.org/document/9937850.  , 2022
Link: http://hdl.handle.net/21..
 
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12

Stochastic resonance effect in binary STDP performed by RRA..:

Salvador Aguilera, Emili ; Rodríguez Martínez, Rosana ; Martin Martínez, Javier...
https://ieeexplore.ieee.org/document/9928738.  , 2022
Link: http://hdl.handle.net/21..
 
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13

Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω..:

Valdivieso, Carlos ; Crespo Yepes, Albert ; Miranda, R...
Agencia Estatal de Investigación PID2019-103869RB-C32.  , 2022
Link: https://ddd.uab.cat/reco..
 
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14

Modeling of the degradation of CMOS inverters under pulsed ..:

Crespo Yepes, Albert ; Ramos Hortal, Regina ; Barajas Ojeda, Enrique...
https://www.sciencedirect.com/science/article/abs/pii/S0038110121001398.  , 2021
Link: http://hdl.handle.net/21..
 
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15

Power-efficient noise-induced reduction of reram cell's tem..:

Ntinas, Vasileios ; Rubio, Antonio ; Sirakoulis, Georgios Ch...
Ministerio de Ciencia e Innovación PID2019-103869RB-C3.  , 2021
Link: https://ddd.uab.cat/reco..
 
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