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Crespo-Yepes, A.
86  results:
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1

Stochastic Resonance in HfO$_{\text{2}}$-Based Memristors: ..:

Salvador, E. ; Rodriguez, R. ; Miranda, E....
IEEE Transactions on Electron Devices.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Noise-Induced Homeostasis in Memristor-Based Neuromorphic S..:

Salvador, E. ; Rodriguez, R. ; Miranda, E....
IEEE Electron Device Letters.  45 (2024)  8 - p. 1524-1527 , 2024
Link: https://doi.org/10.1109/..
 
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3

Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gat..:

Valdivieso, C. ; Crespo-Yepes, A. ; Miranda, R....
Solid-State Electronics.  203 (2023)  - p. 108625 , 2023
Link: https://doi.org/10.1016/..
 
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4

Resistive switching like-behavior in FD-SOI Ω-gate transist..:

Valdivieso, C. ; Rodriguez, R. ; Crespo-Yepes, A...
Solid-State Electronics.  209 (2023)  - p. 108759 , 2023
Link: https://doi.org/10.1016/..
 
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5

Random Telegraph Noise and Bias Temperature Instabilities s..:

Pedreira, G. ; Martin-Martinez, J. ; Crespo-Yepes, A....
Solid-State Electronics.  209 (2023)  - p. 108735 , 2023
Link: https://doi.org/10.1016/..
 
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6

Exploitation of OTFTs variability for PUFs implementation a..:

Claramunt, S. ; Palau, G. ; Arnal, A....
Solid-State Electronics.  207 (2023)  - p. 108698 , 2023
Link: https://doi.org/10.1016/..
 
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7

Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω..:

Valdivieso, C. ; Crespo-Yepes, A. ; Miranda, R....
Solid-State Electronics.  194 (2022)  - p. 108324 , 2022
Link: https://doi.org/10.1016/..
 
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8

CMOS inverter performance degradation and its correlation w..:

Crespo-Yepes, A. ; Nasarre, C. ; Garsot, N....
Solid-State Electronics.  191 (2022)  - p. 108264 , 2022
Link: https://doi.org/10.1016/..
 
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9

Exploiting the KPFM capabilities to analyze at the nanoscal..:

Ruiz, A. ; Claramunt, S. ; Crespo-Yepes, A....
Solid-State Electronics.  186 (2021)  - p. 108061 , 2021
Link: https://doi.org/10.1016/..
 
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10

Modeling of the degradation of CMOS inverters under pulsed ..:

Crespo-Yepes, A. ; Ramos, R. ; Barajas, E....
Solid-State Electronics.  184 (2021)  - p. 108094 , 2021
Link: https://doi.org/10.1016/..
 
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11

MOSFET degradation dependence on input signal power in a RF..:

Crespo-Yepes, A. ; Barajas, E. ; Martin-Martinez, J....
Microelectronic Engineering.  178 (2017)  - p. 289-292 , 2017
Link: https://doi.org/10.1016/..
 
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12

New high resolution Random Telegraph Noise (RTN) characteri..:

Maestro, M. ; Diaz, J. ; Crespo-Yepes, A....
Solid-State Electronics.  115 (2016)  - p. 140-145 , 2016
Link: https://doi.org/10.1016/..
 
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13

Current-limiting and ultrafast system for the characterizat..:

Diaz-Fortuny, J. ; Maestro, M. ; Martin-Martinez, J....
Review of Scientific Instruments.  87 (2016)  6 - p. , 2016
Link: https://doi.org/10.1063/..
 
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14

Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM ..:

Maestro, M. ; Martin-Martinez, J. ; Diaz, J....
Microelectronic Engineering.  147 (2015)  - p. 176-179 , 2015
Link: https://doi.org/10.1016/..
 
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15

A shapeshifting evolvable hardware mechanism based on recon..:

Martin-Martinez, J. ; Almudever, C.G. ; Crespo-Yepes, A....
Microelectronics Reliability.  54 (2014)  8 - p. 1500-1510 , 2014
Link: https://doi.org/10.1016/..
 
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