Cvitkovich, L.
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1

Variability in Si/SiGe and Si/SiO2 Spin Qubits due to Inter..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Cvitkovich, L. ; Sklenard, B. ; Waldhor, D.... - p. 341-344 , 2023
 
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2

Multiscale Modeling Study of Native Oxide Growth on a Si(10..:

, In: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC),
Cvitkovich, L. ; Jech, M. ; Waldhor, D.... - p. 235-238 , 2021
 
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3

A DLTS Study on Deep Trench Processing-Induced Trap States ..:

Stampfer, Paul ; Roger, Frederic ; Cvitkovich, Lukas..
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 161-167 , 2024
 
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7

Intrinsic Electron Trapping in Amorphous Silicon Nitride (a..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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10

Metastability of Negatively Charged Hydroxyl-E' Centers and..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
 
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11

Statistical Ab Initio Analysis of Electron Trapping Oxide D..:

, In: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC),
 
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15

Work-Related Injury among Direct Care Occupations in Britis..:

Alamgir, H. ; Cvitkovich, Y. ; Yu, S..
Occupational and Environmental Medicine.  64 (2007)  11 - p. 769-775 , 2007
 
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