D'have, Koen
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1

Investigation of Distortion in Wafer-to-wafer Bonding with ..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Kang, Shuo ; Iacovo, Serena ; D'have, Koen... - p. 386-393 , 2024
 
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2

A Study of SiCN Wafer-to-Wafer Bonding and Impact of Wafer ..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Iacovo, Serena ; D'have, Koen ; Okudur, Oguzhan Orkut... - p. 1410-1417 , 2023
 
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10

Surface Trapping of Ions and Symmetric Addressing Scheme fo..:

Zhang, Hua ; D'havé, Koen
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals.  351 (2000)  1 - p. 27-34 , 2000
 
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12

Analogue Grey Level in SSFLCD by Varying Surface Anchoring:

Zhang, Hua ; D'havé, Koen ; Verweire, Bart.
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals.  331 (1999)  1 - p. 227-234 , 1999
 
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13

Electrical and Optical Measurements of the Image Sticking E..:

Vleeschouwer, Herbert De ; Verweire, Bart ; D'have, Koen.
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals.  331 (1999)  1 - p. 567-574 , 1999
 
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14

Characterization of the biaxiality of the Fuji‐Wide View fi..:

Vermeirsch, Koenraad ; D'havé, Koen ; Verweire, Bart
SID Symposium Digest of Technical Papers.  30 (1999)  1 - p. 677-680 , 1999
 
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15

Influence of Transverse Dipole Statistics on Transmission C..:

Pauwels, Herman ; Verweire, Bart ; D'havé, Koen
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals.  331 (1999)  1 - p. 201-208 , 1999
 
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