Díaz, Carlos H.
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1

Device Engineering and Benefit Maximization for Advanced Cr..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Chiang, Hung-Li ; Wu, Jui-Jen ; Liao, Pei-Jun... - p. 1-2 , 2024
 
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3

Challenges toward Low-Power SOT-MRAM:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Lin, Shy-Jay ; Huang, Yen-Lin ; Song, MingYaun... - p. 1-7 , 2021
 
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5

Field-Effect Mobility of InAs Surface Channel nMOSFET With ..:

Shih-Wei Wang ; Vasen, Timothy ; Doornbos, Gerben...
IEEE Transactions on Electron Devices.  62 (2015)  8 - p. 2429-2436 , 2015
 
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Formation of multiple dislocations in Si solid-phase epitax..:

Shen, T.M. ; Wang, S.J. ; Tung, Y.T....
Computational Materials Science.  104 (2015)  - p. 219-224 , 2015
 
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13

The Method to Optimize Gate Oxide Integrity, Hot Carrier Ef..:

Shih, Jiaw-Ren ; Lee, Jian-Hsing ; Chen, Shui-Hung...
Japanese Journal of Applied Physics.  38 (1999)  11B - p. L1287 , 1999
 
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