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Dai, Rongwang
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1

Structure and RF performance evolution of polycrystalline s..:

Dai, Rongwang ; Liu, Yun ; Ding, Jingjun...
Materials Science in Semiconductor Processing.  177 (2024)  - p. 108330 , 2024
Link: https://doi.org/10.1016/..
 
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2

Determination of conduction type in high-resistivity silico..:

Li, Minghao ; Liu, Yun ; Wei, Tao...
Applied Physics Letters.  122 (2023)  11 - p. , 2023
Link: https://doi.org/10.1063/..
 
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3

Study on the fundamental factors of the property evolution ..:

Dai, Rongwang ; Liu, Yun ; Wang, Ziwen...
Semiconductor Science and Technology.  38 (2023)  9 - p. 095002 , 2023
Link: https://doi.org/10.1088/..
 
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4

Development of the conductivity type inversion caused by th..:

Li, Minghao ; Liu, Yun ; Wei, Tao...
Applied Physics Express.  16 (2023)  3 - p. 031003 , 2023
Link: https://doi.org/10.35848..
 
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5

Secondary defects of as-grown oxygen precipitates in nitrog..:

Tuo, Huan ; Liu, Yun ; Li, Minghao...
Materials Science in Semiconductor Processing.  163 (2023)  - p. 107583 , 2023
Link: https://doi.org/10.1016/..
 
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6

Investigation of microscale and nanoscale twin lamellae in ..:

Liu, Yun ; Liu, Wenkai ; Wei, Tao...
Materials Science in Semiconductor Processing.  149 (2022)  - p. 106895 , 2022
Link: https://doi.org/10.1016/..
 
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