Datta, Suman
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2

A Physics-Based Model for Oxide–Semiconductor-Based Ferroel..:

Liang, Fu-Xiang ; Kumar, Shubham ; Ni, Kai...
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4397-4402 , 2024
 
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4

Correlated Oxide Selector for Cross-Point Embedded Non-Vola..:

Luo, Yuan-Chun ; Khanna, Abhishek ; Grisafe, Benjamin...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 916-921 , 2024
 
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9

Ferroelectric Gate Stack Engineering with Tunnel Dielectric..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Das, Dipjyoti ; Park, Hyeonwoo ; Wang, Zekai... - p. 1-3 , 2024
 
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10

Analyzing Total-Ionizing-Dose Induced Memory Window Degrada..:

Woo, Sola ; Aabrar, Khandker Akif ; Datta, Suman.
IEEE Transactions on Device and Materials Reliability.  24 (2024)  1 - p. 84-88 , 2024
 
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12

Amorphous Ta2SnO6: A hole-dopable p-type oxide:

Hu, Yaoqiao ; Schlom, Darrell ; Datta, Suman.
Applied Surface Science.  613 (2023)  - p. 155981 , 2023
 
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13

Cryogenic CMOS as an Enabler for Low Power Dynamic Logic:

, In: 2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED),
 
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14

A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Me..:

Ma, Xiaoyang ; Deng, Shan ; Wu, Juejian...
IEEE Electron Device Letters.  44 (2023)  7 - p. 1088-1091 , 2023
 
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