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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Ch..:
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2024 IEEE International Memory Workshop (IMW) ,
7
Design Framework for Ferroelectric Gate Stack Engineering o..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
9
Ferroelectric Gate Stack Engineering with Tunnel Dielectric..:
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2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) ,
13