David H. Seo
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2

Particle Defect Reduction Through YF3 Coated Remote Plasma ..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Seo, Hyojeong ; Yang, Jeonghye ; Ma, Young Jae... - p. 1-5 , 2020
 
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3

Reliable Multivalued Conductance States in TaOx Memristors ..:

Lee, Myoung-Jae ; Park, Gyeong-Su ; Seo, David H....
ACS Applied Materials & Interfaces.  10 (2018)  35 - p. 29757-29765 , 2018
 
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14

Fabrication and electrical characteristics of graphene-base..:

Lee, Sejoon ; Kim, Sung Min ; Song, Emil B....
Journal of the Korean Physical Society.  61 (2012)  1 - p. 108-112 , 2012
 
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