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De Ceuninck, W.A
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1

Optimized selection of materials for IGBT module packaging:

Alavi, O. ; De Ceuninck, W. ; Daenen, M.
Microelectronics Reliability.  138 (2022)  - p. 114736 , 2022
Link: https://doi.org/10.1016/..
 
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2

Heat-transfer based characterization of DNA on synthetic sa..:

Murib, M.S. ; Yeap, W.S. ; Eurlings, Y....
Sensors and Actuators B: Chemical.  230 (2016)  - p. 260-271 , 2016
Link: https://doi.org/10.1016/..
 
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3

Improving the sensitivity of the heat-transfer method (HTM)..:

Eersels, K. ; van Grinsven, B. ; Vandenryt, T....
physica status solidi (a).  212 (2015)  6 - p. 1320-1326 , 2015
Link: https://doi.org/10.1002/..
 
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4

Phase transitions in lipid vesicles detected by a complemen..:

Losada‐Pérez, P. ; Jiménez‐Monroy, K. L. ; van Grinsven, B....
physica status solidi (a).  211 (2014)  6 - p. 1377-1388 , 2014
Link: https://doi.org/10.1002/..
 
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5

Heat transfer resistance as a tool to quantify hybridizatio..:

Cornelis, P. ; Vandenryt, T. ; Wackers, G....
Diamond and Related Materials.  48 (2014)  - p. 32-36 , 2014
Link: https://doi.org/10.1016/..
 
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6

Implementing heat transfer resistivity as a key element in ..:

Bers, K. ; van Grinsven, B. ; Vandenryt, T....
Diamond and Related Materials.  38 (2013)  - p. 45-51 , 2013
Link: https://doi.org/10.1016/..
 
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7

Heat-transfer-based detection of l-nicotine, histamine, and..:

Peeters, M. ; Csipai, P. ; Geerets, B....
Analytical and Bioanalytical Chemistry.  405 (2013)  20 - p. 6453-6460 , 2013
Link: https://doi.org/10.1007/..
 
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8

Electronic monitoring of chemical DNA denaturation on nanoc..:

Murib, M. S. ; van Grinsven, B. ; Grieten, L....
physica status solidi (a).  210 (2013)  5 - p. 911-917 , 2013
Link: https://doi.org/10.1002/..
 
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9

Rapid assessment of the stability of DNA duplexes by impedi..:

van Grinsven, B. ; Vanden Bon, N. ; Grieten, L....
Lab on a Chip.  11 (2011)  9 - p. 1656 , 2011
Link: https://doi.org/10.1039/..
 
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10

Increasing the mean grain size in copper films and features:

Vanstreels, K. ; Brongersma, S.H. ; Tokei, Zs....
Journal of Materials Research.  23 (2008)  3 - p. 642-662 , 2008
Link: https://doi.org/10.1557/..
 
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11

Lifetime modeling of intrinsic gate oxide breakdown at high..:

Moonen, R. ; Vanmeerbeek, P. ; Lekens, G....
Microelectronics Reliability.  47 (2007)  9-11 - p. 1389-1393 , 2007
Link: https://doi.org/10.1016/..
 
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12

Electrical transport measurements and emission properties o..:

Deferme, W. ; Bogdan, A. ; Bogdan, G....
physica status solidi (a).  204 (2007)  9 - p. 3017-3022 , 2007
Link: https://doi.org/10.1002/..
 
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13

A new method for the lifetime determination of submicron me..:

Vanstreels, K. ; D'Olieslaeger, M. ; De Ceuninck, W...
Microelectronics Reliability.  45 (2005)  3-4 - p. 753-759 , 2005
Link: https://doi.org/10.1016/..
 
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14

Understanding oxide degradation mechanisms in ultra-thin Si..:

Aresu, S. ; De Ceuninck, W. ; Degraeve, R....
Microelectronic Engineering.  80 (2005)  - p. 182-185 , 2005
Link: https://doi.org/10.1016/..
 
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15

Advantage of In-situ over Ex-situ techniques as reliability..:

Soussan, P. ; Lekens, G. ; Dreesen, R...
Microelectronics Reliability.  43 (2003)  9-11 - p. 1785-1790 , 2003
Link: https://doi.org/10.1016/..
 
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