De Gendt, S.
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2

Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Inte..:

Nagano, F. ; Inoue, F. ; Phommahaxay, A....
ECS Journal of Solid State Science and Technology.  12 (2023)  3 - p. 033002 , 2023
 
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6

Void Formation Mechanism Related to Particles During Wafer-..:

Nagano, F. ; Iacovo, S. ; Phommahaxay, A....
ECS Journal of Solid State Science and Technology.  11 (2022)  6 - p. 063012 , 2022
 
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7

Trap Density Assessment on Multilayer WS2 using Power-Depen..:

Leonhardt, A. ; Nuytten, T. ; de la Rosa, C. J. Lockhart...
ECS Journal of Solid State Science and Technology.  9 (2020)  9 - p. 093016 , 2020
 
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8

Analysis of Transferred MoS2 Layers Grown by MOCVD: Evidenc..:

Schoenaers, B. ; Leonhardt, A. ; Mehta, A. N....
ECS Journal of Solid State Science and Technology.  9 (2020)  9 - p. 093001 , 2020
 
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9

Film Characterization of Low-Temperature Silicon Carbon Nit..:

Nagano, F. ; Iacovo, S. ; Phommahaxay, A....
ECS Journal of Solid State Science and Technology.  9 (2020)  12 - p. 123011 , 2020
 
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10

Investigation of the Li-Ion Insertion Mechanism for Amorpho..:

Moitzheim, S. ; De Gendt, S. ; Vereecken, P. M.
Journal of The Electrochemical Society.  166 (2019)  2 - p. A1-A9 , 2019
 
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12

Toward 3D Thin-Film Batteries: Optimal Current-Collector De..:

Moitzheim, S. ; Balder, J. E. ; Ritasalo, R....
ACS Applied Energy Materials.  2 (2019)  3 - p. 1774-1783 , 2019
 
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