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De Keersgieter, A.
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1

Predictive and prospective calibrated TCAD to improve devic..:

Eyben, Pierre ; De Keersgieter, An ; Matagne, Philippe...
Japanese Journal of Applied Physics.  63 (2024)  4 - p. 04SP03 , 2024
Link: https://doi.org/10.35848..
 
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2

On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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3

Backside Power Delivery: Game Changer and Key Enabler of Ad..:

, In: 2023 International Electron Devices Meeting (IEDM),
Veloso, A. ; Vermeersch, B. ; Chen, R.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

Nanosheet-based Complementary Field-Effect Transistors (CFE..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Mertens, H. ; Hosseini, M. ; Chiarella, T.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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5

Compact Physics Hot-Carrier Degradation Model Valid over a ..:

Tyaginov, Stanislav ; Bury, Erik ; Grill, Alexander...
Micromachines.  14 (2023)  11 - p. 2018 , 2023
Link: https://doi.org/10.3390/..
 
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6

Nanosheet-based Device Architectures with Front/Backside Co..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
Veloso, A. ; Eneman, G. ; Matagne, P.... - p. 1-5 , 2023
Link: https://doi.org/10.23919..
 
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7

Physica status solidi 

Volume 130, Number 1: July 1  Physica status solidi ; Volume 130, Number 1, B
Alberts, H. L ; Alybakov, A. A ; Anastassakis, E... - Reprint 2021 . , [2022]
Link: https://doi.org/10.1515/..
 
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8

Insights into Scaled Logic Devices Connected from Both Wafe..:

, In: 2022 International Electron Devices Meeting (IEDM),
Veloso, A. ; Eneman, G. ; Matagne, P.... - p. 23.3.1-23.3.4 , 2022
Link: https://doi.org/10.1109/..
 
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9

Innovations in Transistor Architecture and Device Connectiv..:

, In: 2022 International Conference on IC Design and Technology (ICICDT),
Veloso, A. ; Eneman, G. ; De Keersgieter, A.... - p. 51-54 , 2022
Link: https://doi.org/10.1109/..
 
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10

Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Veloso, A. ; Jourdain, A. ; Radisic, D.... - p. 284-285 , 2022
Link: https://doi.org/10.1109/..
 
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11

(Invited) Innovations in Transistor Architecture and Device..:

Veloso, Anabela ; Eneman, Geert ; Simoen, Eddy...
ECS Transactions.  108 (2022)  2 - p. 31-42 , 2022
Link: https://doi.org/10.1149/..
 
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12

The impact of self-heating and its implications on hot-carr..:

Tyaginov, S. ; Makarov, A. ; Chasin, A....
Microelectronics Reliability.  122 (2021)  - p. 114156 , 2021
Link: https://doi.org/10.1016/..
 
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13

(Keynote) Gate-All-Around Nanowire & Nanosheet FETs for Adv..:

Veloso, Anabela ; Matagne, Philippe ; Jang, Doyoung...
ECS Transactions.  97 (2020)  5 - p. 3-14 , 2020
Link: https://doi.org/10.1149/..
 
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14

Nanowire & Nanosheet Fets for Advanced Ultra-Scaled, High-D..:

, In: 2020 China Semiconductor Technology International Conference (CSTIC),
Veloso, A. ; Matagne, P. ; Eneman, G.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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15

Physical Modeling the Impact of Self-Heating on Hot-Carrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tyaginov, S. ; Makarov, A. ; Chasin, A.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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