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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Threshold Voltage Drift and Recovery of SiC Trench MOSFETs ..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
The Concept of Safe Operating Area for Gate Dielectrics: th..:
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4
Physica status solidi
Volume 67, Number 1: September 16
Physica status solidi ; Volume 67, Number 1, A
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5
Physica status solidi
Volume 61, Number 2: October 16
Physica status solidi ; Volume 61, Number 2, A
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7
Physica status solidi
Volume 76, Number 2: April 16
Physica status solidi ; Volume 76, Number 2, A
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2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
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