E-LIB Suche - Ergebnisse für: Degraeve, Robin

1

Comprehensive Performance and Reliability Assessment of Se-..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Ravsher, Taras ; Degraeve, Robin ; Garbin, Daniele... - p. 7A.5-1-7A.5-9 , 2024

Link: https://doi.org/10.1109/..

2

Chalcogenide Ovonic Threshold Switching Selector:

Zhao, Zihao ; Clima, Sergiu ; Garbin, Daniele...
Nano-Micro Letters. 16 (2024) 1 - p. , 2024

Link: https://doi.org/10.1007/..

3

Evidence of Heat‐Assisted Atomic Migration in GeSe Self‐Sel..:

Ravsher, Taras ; Garbin, Daniele ; Fantini, Andrea...
physica status solidi (RRL) – Rapid Research Letters. , 2024

Link: https://doi.org/10.1002/..

4

An In-Depth Study of Ring Oscillator Reliability under Acce..:

Diaz-Fortuny, Javier ; Saraza-Canflanca, Pablo ; Bury, Erik..
Micromachines. 15 (2024) 6 - p. 769 , 2024

Link: https://doi.org/10.3390/..

5

SILC and TDDB reliability of novel low thermal budget RMG g..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Vici, Andrea ; Degraeve, Robin ; Horiguchi, Naoto.. - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

6

Demonstration of Chip Overclock Detection by Employing Tamp..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Diaz-Fortuny, Javier ; Saraza-Canflanca, Pablo ; Romano-Molar, Alex... - p. 4C.1-1-4C.1-7 , 2024

Link: https://doi.org/10.1109/..

7

Physics-informed machine learning to analyze oxide defect-i..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Varanasi, Anirudh ; Degraeve, Robin ; Roussel, Philippe J... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

8

Improving the Tamper-Aware Odometer Concept by Enhancing Dy..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Diaz-Fortuny, Javier ; Sangani, Dishant ; Saraza-Canflanca, Pablo... - p. 1-9 , 2023

Link: https://doi.org/10.1109/..

9

Fault Attack Investigation on TaOx Resistive-RAM for Cyber ..:

Kumar, Ankit ; Degraeve, Robin ; Beckers, Arthur...
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4170-4177 , 2023

Link: https://doi.org/10.1109/..

10

New Insights of the Switching Process in GeAsTe Ovonic Thre..:

Hu, Zeyu ; Zhang, Weidong ; Degraeve, Robin...
IEEE Transactions on Electron Devices. 70 (2023) 2 - p. 812-818 , 2023

Link: https://doi.org/10.1109/..

11

Polarity‐Induced Threshold Voltage Shift in Ovonic Threshol..:

Ravsher, Taras ; Garbin, Daniele ; Fantini, Andrea...
physica status solidi (RRL) – Rapid Research Letters. 17 (2023) 8 - p. , 2023

Link: https://doi.org/10.1002/..

12

Analytical Markov Model to Calculate TDDB at Any Voltage an..:

Vici, Andrea ; Degraeve, Robin ; Franco, Jacopo...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6512-6519 , 2023

Link: https://doi.org/10.1109/..

13

Benchmarking of Machine Learning Methods for Multiscale The..:

Coenen, David ; Oprins, Herman ; Degraeve, Robin.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 7 - p. 2264-2275 , 2023

Link: https://doi.org/10.1109/..

14

Self-Rectifying Memory Cell Based on SiGeAsSe Ovonic Thresh..:

Ravsher, Taras ; Garbin, Daniele ; Fantini, Andrea...
IEEE Transactions on Electron Devices. 70 (2023) 5 - p. 2276-2281 , 2023

Link: https://doi.org/10.1109/..

15

Understanding the Cycling-Dependent Threshold Voltage Insta..:

, In: 2022 International Electron Devices Meeting (IEDM),

Yamaguchi, Marina ; Degraeve, Robin ; Garbin, Daniele... - p. 5.1.1-5.1.4 , 2022

Link: https://doi.org/10.1109/..