Deist, Benjamin R.
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7

Trap detection in electrically stressed AlGaN/GaN HEMTs usi..:

Cheney, D.J. ; Deist, R. ; Gila, B....
Microelectronics Reliability.  52 (2012)  12 - p. 2884-2888 , 2012
 
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8

Old Dogs and New Tricks: Adapting Existing Analytical E-Bea..:

Willenberg, B ; Deist, R ; Dempere, L
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1476-1477 , 2011
 
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