Dell, John
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1

Learning from experience - Radiology ancillary review of pr..:

De Leon-Benedetti, Laura ; Andronikou, Savvas ; Serai, Suraj...
Current Problems in Diagnostic Radiology.  53 (2024)  2 - p. 182-184 , 2024
 
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5

Engineering 1/f noise in porous silicon thin films for ther..:

Sharma, Pritam ; Dell, John ; Parish, Giacinta.
Microporous and Mesoporous Materials.  324 (2021)  - p. 111302 , 2021
 
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9

Substrate heating effects on properties of CdS thin films p..:

, In: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC),
 
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11

Investigation of crystallized germanium thin films and germ..:

Lee, Won-Jae ; Sharp, James ; Umana-Membreno, Gilberto A...
Materials Science in Semiconductor Processing.  30 (2015)  - p. 413-419 , 2015
 
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14

Thermally induced damages of PECVD SiNx thin films:

Liu, Yinong ; Jehanathan, Neerushana ; Dell, John
Journal of Materials Research.  26 (2011)  19 - p. 2552-2557 , 2011
 
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