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2023 IEEE Energy Conversion Congress and Exposition (ECCE) ,
5
Observations on Ruggedness Degradation of Planar-gate SiC M..:
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2023 IEEE Energy Conversion Congress and Exposition (ECCE) ,
10
Investigation on Dynamic Degradation of SiC MOSFETs after T..:
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2023 2nd Asia Power and Electrical Technology Conference (APET) ,
11
A Fast-Recovery Split Gate Trench MOSFET Integrated with Ar..:
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2022 IEEE International Power Electronics and Application Conference and Exposition (PEAC) ,
15