Deschanvres, Jean-Luc
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Resilience of Cuprous Oxide under Oxidizing Thermal Treatme..:

Resende, João ; Chaix-Pluchery, Odette ; Rovezzi, Mauro...
The Journal of Physical Chemistry C.  123 (2019)  14 - p. 8663-8670 , 2019
 
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Evaluation of Alternative Atomistic Models for the Incipien..:

Chu, Manh-Hung ; Tian, Liang ; Chaker, Ahmad...
Journal of Electronic Materials.  46 (2017)  6 - p. 3512-3517 , 2017
 
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