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Disegni, F.
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1

ASIL-D automotive-grade microcontroller in 28nm FD-SOI with..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Grossier, N. ; Disegni, F. ; Ventre, A.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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2

An Extended Temperature Range ePCM Memory in 90-nm BCD for ..:

, In: ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC),
Carissimi, M. ; Auricchio, C. ; Calvetti, E.... - p. 373-376 , 2022
Link: https://doi.org/10.1109/..
 
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3

BEOL Process Effects on ePCM Reliability:

Redaelli, A. ; Gandolfo, A. ; Samanni, G....
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 563-568 , 2022
Link: https://doi.org/10.1109/..
 
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4

Heater system optimization for robust ePCM reliability and ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ranica, R. ; Berthelon, R. ; Gandolfo, A.... - p. 28.1.1-28.1.4 , 2021
Link: https://doi.org/10.1109/..
 
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5

2-Mb Embedded Phase Change Memory With 16-ns Read Access Ti..:

, In: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC),
Carissimi, M. ; Zurla, R. ; Auricchio, C.... - p. 135-138 , 2019
Link: https://doi.org/10.1109/..
 
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6

BEOL Process Effects on ePCM Reliability:

A. Redaelli ; A. Gandolfo ; G. Samanni...
https://ieeexplore.ieee.org/document/9743565/.  , 2022
Link: https://doi.org/10.1109/..
 
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7

539 Selection of candidates for cardiac resynchronization t..:

PERALDO, C ; PUGLISI, A ; SASSARA, M...
European Journal of Echocardiography.  4 (2003)  - p. S65 , 2003
Link: https://doi.org/10.1016/..
 
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