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1

Analysis of the charging kinetics in silver nanoparticles-s..:

Djaou, C ; Villeneuve-Faure, C ; Makasheva, K..
Nano Express. 2 (2021) 4 - p. 044001 , 2021

Link: https://doi.org/10.1088/..

2

2D Charge Density Probing at Aluminum / SiNx Interface: a S..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),

Djaou, C. ; Villeneuve-Faure, C. ; Boudou, L... - p. 451-454 , 2020

Link: https://doi.org/10.1109/..

3

Impact of a laser pulse on HfO2-based RRAM cells reliabilit..:

, In: 2016 International Conference on Microelectronic Test Structures (ICMTS),

Krakovinsky, A. ; Bocquet, M. ; Wacquez, R.... - p. 152-156 , 2016

Link: https://doi.org/10.1109/..

4

Analysis of the charging kinetics in silver nanoparticles-s..:

Djaou, C ; Villeneuve-Faure, C ; Makasheva, Kremena..
info:eu-repo/semantics/altIdentifier/doi/10.1088/2632-959X/ac3886. , 2021

Link: https://hal.science/hal-..

5

Analysis of the charging kinetics in silver nanoparticles-s..:

Djaou, C ; Villeneuve-Faure, C ; Makasheva, Kremena..
info:eu-repo/semantics/altIdentifier/doi/10.1088/2632-959X/ac3886. , 2021

Link: https://hal.archives-ouv..

6

2D Charge Density Probing at Aluminum / SiN x Interface: a ..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-03003111. , 2020

Link: https://hal.science/hal-..

7

2D Charge Density Probing at Aluminum / SiN x Interface: a ..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-03003111. , 2020

Link: https://hal.archives-ouv..

8

Thermally induced effects on the injection and retention of..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-03004121. , 2019

Link: https://hal.science/hal-..

9

Thermally induced effects on the injection and retention of..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-03004121. , 2019

Link: https://hal.archives-ouv..

10

Etude par Microscopie à sonde de Kelvin (KPFM) des phénomèn..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-02397415. , 2018

Link: https://hal.archives-ouv..

11

Etude par Microscopie à sonde de Kelvin (KPFM) des phénomèn..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-02397415. , 2018

Link: https://hal.science/hal-..

12

Etude par Microscopie à sonde de Kelvin (KPFM) des phénomèn..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-02397415. , 2018

Link: https://hal.science/hal-..

13

Etude par Microscopie à sonde de Kelvin (KPFM) des phénomèn..:

Djaou, C ; Villeneuve-Faure, Christina ; Boudou, Laurent..
hal-02397415. , 2018

Link: https://hal.science/hal-..

14

Impact of a Laser Pulse On HfO$_2$-based RRAM Cells Reliabi..:

Krakovinsky, A ; Bocquet, Marc ; Wacquez, R...
info:eu-repo/grantAgreement// CT208/EU/Research on optimal architecture and integration of 22/20 nm node core digital CMOS technology – electrical proof of concept [REACHING 22]/Catrene -. , 2016

Link: https://hal.archives-ouv..

15

Impact of a Laser Pulse On HfO$_2$-based RRAM Cells Reliabi..:

Krakovinsky, A ; Bocquet, Marc ; Wacquez, R...
info:eu-repo/grantAgreement// CT208/EU/Research on optimal architecture and integration of 22/20 nm node core digital CMOS technology – electrical proof of concept [REACHING 22]/Catrene -. , 2016

Link: https://hal.science/hal-..

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